Atkinson; Chris D.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Atkinson; Chris D..The latest application filed is for "by-die-exposure for patterning of holes in edge die".
- Atkinson; Chris D. - Lewisville TX
| Patent | Date |
|---|---|
| By-die-exposure for patterning of holes in edge die Grant 8,273,523 - Detweiler , et al. September 25, 2 | 2012-09-25 |
| Method and apparatus for cassette integrity testing using a wafer sorter Grant 7,596,456 - Mollenkopf , et al. September 29, 2 | 2009-09-29 |
| By-die-exposure For Patterning Of Holes In Edge Die App 20080160779 - Detweiler; Shangting ; et al. | 2008-07-03 |
| System and method for exposure of partial edge die Grant 7,374,866 - Atkinson , et al. May 20, 2 | 2008-05-20 |
| Method and apparatus for cassette integrity testing using a wafer sorter App 20070118300 - Mollenkopf; Kelly C. ; et al. | 2007-05-24 |
| System and method for exposure of partial edge die App 20060078828 - Atkinson; Chris D. ; et al. | 2006-04-13 |
| Error reduction in semiconductor processes Grant 6,848,066 - Atkinson , et al. January 25, 2 | 2005-01-25 |
| Error reduction in semiconductor processes App 20040029029 - Atkinson, Chris D. ; et al. | 2004-02-12 |
| Error reduction in semiconductor processes Grant 6,645,684 - Atkinson , et al. November 11, 2 | 2003-11-11 |
| Error reduction in semiconductor processes App 20030068833 - Atkinson, Chris D. ; et al. | 2003-04-10 |
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