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Patent applications and USPTO patent grants for Atchison; Nick.The latest application filed is for "method of a comprehensive sequential analysis of the yield losses of semiconductor wafers".
Patent | Date |
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Method of a comprehensive sequential analysis of the yield losses of semiconductor wafers Grant 6,393,602 - Atchison , et al. May 21, 2 | 2002-05-21 |
Method for the calculation of wafer probe yield limits from in-line defect monitor data Grant 6,324,481 - Atchison , et al. November 27, 2 | 2001-11-27 |
Method for analyzing probe yield sensitivities to IC design Grant 6,210,983 - Atchison , et al. April 3, 2 | 2001-04-03 |
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