ASML NETHERLANS B.V.
Patent Applications and Registrations
Patent applications and USPTO patent grants for ASML NETHERLANS B.V..The latest application filed is for "method of determining characteristic of patterning process based on defect for reducing hotspot".
- ASML NETHERLANS B.V. - Veldhoven NL
| Patent | Date |
|---|---|
| Method Of Determining Characteristic Of Patterning Process Based On Defect For Reducing Hotspot App 20220229374 - PENG; Xingyue ; et al. | 2022-07-21 |
| Lithographic Apparatus, Device Manufacturing Method And Associated Data Processing Apparatus And Computer Program Product App 20160334712 - CEKLI; Hakki Ergun ; et al. | 2016-11-17 |
| Lithographic Apparatus And Device Manufacturing Method App 20160299442 - BUTLER; Hans ; et al. | 2016-10-13 |
| Imprint Lithography App 20090212462 - KRUIJT-STEGEMAN; Yvonne Wendela ; et al. | 2009-08-27 |
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