loadpatents
name:-0.0069279670715332
name:-0.010190963745117
name:-0.0011250972747803
ASML Masktools Netherlands B.V. Patent Filings

ASML Masktools Netherlands B.V.

Patent Applications and Registrations

Patent applications and USPTO patent grants for ASML Masktools Netherlands B.V..The latest application filed is for "method of identifying an extreme interaction pitch region, methods of designing mask patterns and manufacturing masks, device manufacturing methods and computer programs".

Company Profile
0.8.4
  • ASML Masktools Netherlands B.V. - Veldhoven NL
  • ASML Masktools Netherlands B.V. - La Veldhoven NL
  • ASML MASKTOOLS NETHERLANDS B.V. -
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method of identifying an extreme interaction pitch region, methods of designing mask patterns and manufacturing masks, device manufacturing methods and computer programs
Grant 7,735,052 - Shi , et al. June 8, 2
2010-06-08
Optical proximity correction
Grant RE40,084 - Petersen , et al. February 19, 2
2008-02-19
Method of identifying an extreme interaction pitch region, methods of designing mask patterns and manufacturing masks, device manufacturing methods and computer programs
App 20050034096 - Shi, Xuelong ;   et al.
2005-02-10
Hybrid phase-shift mask
App 20040067423 - Chen, Jang Fung ;   et al.
2004-04-08
Optical proximity correction method utilizing serifs having variable dimensions
Grant 6,670,081 - Laidig , et al. December 30, 2
2003-12-30
Hybrid phase-shift mask
Grant 6,623,895 - Chen , et al. September 23, 2
2003-09-23
Method and apparatus for detecting aberrations in a projection lens utilized for projection optics
App 20030098970 - Chen, J. Fung
2003-05-29
Optical proximity correction
Grant 6,541,167 - Petersen , et al. April 1, 2
2003-04-01
Method of patterning sub-0.25.lambda. line features with high transmission, "attenuated" phase shift masks
Grant 6,482,555 - Chen , et al. November 19, 2
2002-11-19
Method of patterning sub-0.25lambda line features with high transmission, "attenuated" phase shift masks
App 20020048708 - Chen, J. Fung ;   et al.
2002-04-25
System and method of providing optical proximity correction for features using phase-shifted halftone transparent/semi-transparent features
Grant 6,335,130 - Chen , et al. January 1, 2
2002-01-01
Method of fine feature edge tuning with optically-halftoned mask
Grant 6,114,071 - Chen , et al. September 5, 2
2000-09-05

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed