Ashwal; Eltsafon
Patent Applications and Registrations
Patent applications and USPTO patent grants for Ashwal; Eltsafon.The latest application filed is for "accuracy improvements in optical metrology".
- Ashwal; Eltsafon - Migdal Ha' emek IL
- Ashwal; Eltsafon - Haifa IL
| Patent | Date |
|---|---|
| Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology Grant 10,831,108 - Marciano , et al. November 10, 2 | 2020-11-10 |
| Accuracy Improvements In Optical Metrology App 20180047646 - Bringoltz; Barak ; et al. | 2018-02-15 |
| Methods Of Analyzing And Utilizing Landscapes To Reduce Or Eliminate Inaccuracy In Overlay Optical Metrology App 20160313658 - Marciano; Tal ; et al. | 2016-10-27 |
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