loadpatents
name:-0.0078577995300293
name:-0.0095510482788086
name:-0.00074219703674316
Asanuma; Keita Patent Filings

Asanuma; Keita

Patent Applications and Registrations

Patent applications and USPTO patent grants for Asanuma; Keita.The latest application filed is for "exposure system, test mask for monitoring polarization, and method for monitoring polarization".

Company Profile
0.6.4
  • Asanuma; Keita - Oita JP
  • Asanuma; Keita - Oita-shi JP
  • Asanuma; Keita - Yokohama JP
  • Asanuma, Keita - Yokohama-shi JP
  • Asanuma; Keita - Yokkaichi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Exposure system, test mask for monitoring polarization, and method for monitoring polarization
Grant 7,440,104 - Sato , et al. October 21, 2
2008-10-21
Apparatus for correcting a plurality of exposure tools, method for correcting a plurality of exposure tools, and method for manufacturing semiconductor device
Grant 7,164,960 - Komine , et al. January 16, 2
2007-01-16
Exposure system, test mask for monitoring polarization, and method for monitoring polarization
App 20060098183 - Sato; Takashi ;   et al.
2006-05-11
Apparatus for correcting a plurality of exposure tools, method for correcting a plurality of exposure tools, and method for manufacturing semiconductor device
App 20050125178 - Komine, Nobuhiro ;   et al.
2005-06-09
Exposure method and method of manufacturing semiconductor device
Grant 6,872,508 - Komine , et al. March 29, 2
2005-03-29
Exposing method
Grant 6,842,230 - Takakuwa , et al. January 11, 2
2005-01-11
Exposing method
App 20030117599 - Takakuwa, Manabu ;   et al.
2003-06-26
Exposure method and method of manufacturing semiconductor device
App 20030016341 - Komine, Nobuhiro ;   et al.
2003-01-23
Method of electrical measurement of misregistration of patterns
Grant 6,288,556 - Sato , et al. September 11, 2
2001-09-11
Exposure tool and method capable of correcting high (N-TH) order light exposure errors depending upon an interfield coordinate
Grant 6,008,880 - Higashiki , et al. December 28, 1
1999-12-28

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