Asano; Mitsuyo

Patent Applications and Registrations

Patent applications and USPTO patent grants for Asano; Mitsuyo.The latest application filed is for "pattern shape measuring method".

Company Profile

0.5.4

Asano; Mitsuyo - Yokohama Kanagawa JP
Asano; Mitsuyo - Yokohama JP
ASANO; Mitsuyo - Yokohama-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Pattern shape measuring method Grant 11,256,947 - Asano February 22, 2	2022-02-22
Pattern Shape Measuring Method App 20200302211 - Asano; Mitsuyo	2020-09-24
Mask pattern verifying method Grant 8,121,387 - Asano , et al. February 21, 2	2012-02-21
Pattern evaluation method and evaluation apparatus and pattern evaluation program Grant 7,673,281 - Yamanaka , et al. March 2, 2	2010-03-02
Mask Pattern Verifying Method App 20080232671 - ASANO; Mitsuyo ; et al.	2008-09-25
Pattern evaluation method and evaluation apparatus and pattern evaluation program App 20080028361 - Yamanaka; Eiji ; et al.	2008-01-31
Image data correction method, lithography simulation method, image data correction system, program, mask and method of manufacturing a semiconductor device Grant 7,313,781 - Asano , et al. December 25, 2	2007-12-25
Image data correction method, lithography simulation method, image data correction system, program , mask and method of manufacturing a semiconductor device App 20050265592 - Asano, Mitsuyo ; et al.	2005-12-01
Method for repairing pattern defect, photo mask using the method, and semiconductor device manufacturing method employing the photo mask Grant 6,335,129 - Asano , et al. January 1, 2	2002-01-01

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