Asano; Etsuko

Patent Applications and Registrations

Patent applications and USPTO patent grants for Asano; Etsuko.The latest application filed is for "semiconductor device, manufacturing method thereof, and measuring method thereof".

Company Profile

0.13.12

Asano; Etsuko - Atsugi JP
Asano; Etsuko - Kanagawa JP
Asano; Etsuko - Kanagawa-ken JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Semiconductor device, manufacturing method thereof, and measuring method thereof Grant 9,261,554 - Tsurume , et al. February 16, 2	2016-02-16
Semiconductor Device, Manufacturing Method Thereof, And Measuring Method Thereof App 20140368230 - TSURUME; Takuya ; et al.	2014-12-18
Semiconductor device, manufacturing method thereof, and measuring method thereof Grant 8,822,272 - Tsurume , et al. September 2, 2	2014-09-02
Memory device and manufacturing method of the same Grant 8,114,719 - Kato , et al. February 14, 2	2012-02-14
Semiconductor device and manufacturing method thereof Grant 7,714,367 - Fujikawa , et al. May 11, 2	2010-05-11
Method for evaluating semiconductor device Grant 7,567,882 - Asano , et al. July 28, 2	2009-07-28
Evaluation method using a TEG, a method of manufacturing a semiconductor device having the TEG, an element substrate and a panel having the TEG, a program for controlling dosage and a computer-readable recording medium recording the program Grant 7,560,293 - Asano , et al. July 14, 2	2009-07-14
Method for manufacturing semiconductor device Grant 7,521,368 - Yamaguchi , et al. April 21, 2	2009-04-21
Semiconductor Device, Manufacturing Method Thereof, and Measuring Method Thereof App 20080277660 - Tsurume; Takuya ; et al.	2008-11-13
Memory Device and Manufacturing Method of the Same App 20080211024 - Kato; Kiyoshi ; et al.	2008-09-04
Evaluation method using a TEG, a method of manufacturing a semiconductor device having the TEG, an element substrate and a panel having the TEG, a program for controlling dosage and a computer-readable recording medium recording the program App 20080026490 - Asano; Etsuko ; et al.	2008-01-31
Method and apparatus for examining semiconductor apparatus and method for designing semiconductor apparatus Grant 7,292,955 - Asano , et al. November 6, 2	2007-11-06
Method for Evaluating Semiconductor Device App 20070228371 - Asano; Etsuko ; et al.	2007-10-04
Evaluation method using a TEG, a method of manufacturing a semiconductor device having a TEG, an element substrate and a panel having the TEG, a program for controlling dosage and a computer-readable recording medium recoding the program Grant 7,256,079 - Asano , et al. August 14, 2	2007-08-14
Semiconductor Device and Manufacturing Method Thereof App 20070170513 - Fujikawa; Saishi ; et al.	2007-07-26
Method for evaluating semiconductor device Grant 7,231,310 - Asano , et al. June 12, 2	2007-06-12
Semiconductor device and manufacturing method thereof Grant 7,202,149 - Fujikawa , et al. April 10, 2	2007-04-10
Method for evaluating semiconductor device Grant 7,112,982 - Honda , et al. September 26, 2	2006-09-26
Method for evaluating semiconductor device App 20050273290 - Asano, Etsuko ; et al.	2005-12-08
Method for manufacturing semiconductor device App 20050250308 - Yamaguchi, Tetsuji ; et al.	2005-11-10
Evaluation method using a TEG, a method of manufacturing a semiconductor device having a TEG, an element substrate and a panel having the TEG, a program for controlling dosage and a computer-readable recording medium recording the program App 20050196883 - Asano, Etsuko ; et al.	2005-09-08
Semiconductor device and manufacturing method thereof App 20050133862 - Fujikawa, Saishi ; et al.	2005-06-23
Method for evaluating semiconductor device App 20050024079 - Honda, Tatsuya ; et al.	2005-02-03
Method and apparatus for examining semiconductor apparatus and method for designing semiconductor apparatus App 20030204820 - Asano, Etsuko ; et al.	2003-10-30

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