Arrington; Justin R.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Arrington; Justin R..The latest application filed is for "method for integrated circuit diagnosis".
- Arrington; Justin R. - Boise ID US
| Patent | Date |
|---|---|
| Electron induced chemical etching and deposition for local circuit repair Grant 8,821,682 - Williamson , et al. September 2, 2 | 2014-09-02 |
| Method for integrated circuit diagnosis Grant 8,809,074 - Williamson , et al. August 19, 2 | 2014-08-19 |
| Profiling solid state samples Grant 8,609,542 - Rueger , et al. December 17, 2 | 2013-12-17 |
| Method For Integrated Circuit Diagnosis App 20130295700 - Williamson; Mark J. ; et al. | 2013-11-07 |
| Profiling Solid State Samples App 20130180950 - Rueger; Neal R. ; et al. | 2013-07-18 |
| Profiling solid state samples Grant 8,389,415 - Rueger , et al. March 5, 2 | 2013-03-05 |
| Method of removing or deposting material on a surface including material selected to decorate a particle on the surface for imaging Grant 8,026,501 - Williamson , et al. September 27, 2 | 2011-09-27 |
| Apparatus And Systems For Integrated Circuit Diagnosis App 20110139368 - Williamson; Mark J. ; et al. | 2011-06-16 |
| Electron induced chemical etching for device level diagnosis Grant 7,892,978 - Williamson , et al. February 22, 2 | 2011-02-22 |
| Electron induced chemical etching and deposition for local circuit repair App 20110017401 - Williamson; Mark J. ; et al. | 2011-01-27 |
| Method Of Enhancing Detection Of Defects On A Surface App 20100320384 - Williamson; Mark J. ; et al. | 2010-12-23 |
| Profiling Solid State Samples App 20100314354 - Rueger; Neal R. ; et al. | 2010-12-16 |
| Electron induced chemical etching and deposition for local circuit repair Grant 7,807,062 - Williamson , et al. October 5, 2 | 2010-10-05 |
| Electron induced chemical etching/deposition for enhanced detection of surface defects Grant 7,791,055 - Williamson , et al. September 7, 2 | 2010-09-07 |
| Profiling solid state samples Grant 7,791,071 - Rueger , et al. September 7, 2 | 2010-09-07 |
| Profiling solid state samples App 20080038863 - Rueger; Neal R. ; et al. | 2008-02-14 |
| Electron induced chemical etching and deposition for local circuit repair App 20080006603 - Williamson; Mark J. ; et al. | 2008-01-10 |
| Electron induced chemical etching/deposition for enhanced detection of surface defects App 20080006786 - Williamson; Mark J. ; et al. | 2008-01-10 |
| Electron induced chemical etching for device level diagnosis App 20080009140 - Williamson; Mark J. ; et al. | 2008-01-10 |
| Electron Induced Chemical Etching For Materials Characterization App 20070278180 - Williamson; Mark J. ; et al. | 2007-12-06 |
| Method and apparatus for integrated circuit failure analysis Grant 6,819,125 - Green , et al. November 16, 2 | 2004-11-16 |
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