Arnold; Ralf

Patent Applications and Registrations

Patent applications and USPTO patent grants for Arnold; Ralf.The latest application filed is for "high accurate contact resistance measurement method using one or more diodes".

Company Profile

2.19.19

Arnold; Ralf - Kunzelsau DE
ARNOLD; RALF - Poing DE
Arnold; Ralf - Aalen DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Electrical traction drive for a vehicle Grant 11,351,868 - Haag , et al. June 7, 2	2022-06-07
High Accurate Contact Resistance Measurement Method Using One Or More Diodes App 20200003824 - ARNOLD; RALF ; et al.	2020-01-02
Electrical Traction Drive For A Vehicle App 20190202294 - Haag; Alexander ; et al.	2019-07-04
Signal generating circuit Grant 8,860,592 - Mattes , et al. October 14, 2	2014-10-14
Beam regulating apparatus for an EUV illumination beam Grant 8,853,642 - Arnold , et al. October 7, 2	2014-10-07
Test Circuit App 20140098847 - MATTES; Heinz ; et al.	2014-04-10
Signal Generating Circuit App 20140097976 - MATTES; Heinz ; et al.	2014-04-10
Beam Regulating Apparatus For An Euv Illumination Beam App 20130248728 - Arnold; Ralf ; et al.	2013-09-26
Method of measuring a deviation of an optical surface from a target shape using interferometric measurement results Grant 8,508,749 - Arnold , et al. August 13, 2	2013-08-13
Method Of Measuring A Deviation Of An Optical Surface From A Target Shape App 20120330609 - ARNOLD; Ralf ; et al.	2012-12-27
Method of measuring a deviation of an optical surface from a target shape Grant 8,264,695 - Arnold , et al. September 11, 2	2012-09-11
Method Of Measuring A Deviation Of An Optical Surface From A Target Shape App 20110141484 - ARNOLD; Ralf ; et al.	2011-06-16
Method of measuring a deviation of an optical surface from a target shape Grant 7,936,521 - Arnold , et al. May 3, 2	2011-05-03
Method Of Measuring A Deviation Of An Optical Surface From A Target Shape App 20100177320 - Arnold; Ralf ; et al.	2010-07-15
Method of manufacturing an optical element Grant 7,728,987 - Arnold , et al. June 1, 2	2010-06-01
Electronic element comprising an electronic circuit which is to be tested and test system arrangement which is used to test the electronic element Grant 7,640,469 - Arnold , et al. December 29, 2	2009-12-29
Optical system, method of manufacturing an optical system and method of manufacturing an optical element Grant 7,605,926 - Hetzler , et al. October 20, 2	2009-10-20
Input and output circuit of an integrated circuit and a method for testing the same Grant 7,453,282 - Arnold , et al. November 18, 2	2008-11-18
System for testing digital components Grant 7,386,776 - Arnold , et al. June 10, 2	2008-06-10
Test apparatus with low-reflection signal distribution Grant 7,355,414 - Arnold , et al. April 8, 2	2008-04-08
Method of Manufacturing an Optical Element App 20080043247 - Arnold; Ralf ; et al.	2008-02-21
Semiconductor circuit device and a system for testing a semiconductor apparatus Grant 7,331,005 - Arnold , et al. February 12, 2	2008-02-12
Input switching arrangement for a semiconductor circuit and test method for unidirectional input drivers in semiconductor circuits Grant 7,308,628 - Spirkl , et al. December 11, 2	2007-12-11
Input and output circuit an integrated circuit and method for testing the same App 20060273820 - Arnold; Ralf ; et al.	2006-12-07
Diffractive optical element Grant 7,139,127 - Arnold , et al. November 21, 2	2006-11-21
Test apparatus with low-reflection signal distribution App 20060186896 - Arnold; Ralf ; et al.	2006-08-24
Electronic element comprising an electronic circuit which is to be tested and test system arrangement which is used to test the electronic element App 20060190792 - Arnold; Ralf ; et al.	2006-08-24
Configurable processing block capable of interacting with external hardware Grant 7,028,162 - Arnold , et al. April 11, 2	2006-04-11
System for testing digital components App 20060069951 - Arnold; Ralf ; et al.	2006-03-30
Method for configuring a configurable hardware block by configuring configurable connections provided around a given type of subunit Grant 6,996,709 - Arnold , et al. February 7, 2	2006-02-07
Semiconductor circuit device and a system for testing a semiconductor apparatus App 20060026475 - Arnold; Ralf ; et al.	2006-02-02
Diffractive optical element App 20050207012 - Arnold, Ralf ; et al.	2005-09-22
Input switching arrangement for a semiconductor circuit and test method for unidirectional input drivers in semiconductor circuits App 20050108603 - Spirkl, Wolfgang ; et al.	2005-05-19
Method for testing a program-controlled unit by an external test device Grant 6,885,963 - Arnold , et al. April 26, 2	2005-04-26
Method for testing a program-controlled unit by an external test device App 20020065624 - Arnold, Ralf ; et al.	2002-05-30
Configurable hardware block App 20020013891 - Arnold, Ralf ; et al.	2002-01-31
Method for configuring a configurable hardware block App 20020010852 - Arnold, Ralf ; et al.	2002-01-24

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