Armagnat; Paul
Patent Applications and Registrations
Patent applications and USPTO patent grants for Armagnat; Paul.The latest application filed is for "digital circuit testable through two pins".
- Armagnat; Paul - Seyssinet N/A FR
| Patent | Date |
|---|---|
| Digital circuit testable through two pins Grant 8,928,340 - Lebourg , et al. January 6, 2 | 2015-01-06 |
| Digital Circuit Testable Through Two Pins App 20120161802 - Lebourg; Philippe ; et al. | 2012-06-28 |
| Method for characterizing a bit detection event Grant 7,941,738 - Le-Gall , et al. May 10, 2 | 2011-05-10 |
| Scan test circuitry using a state machine and a limited number of dedicated pins Grant 7,739,566 - Armagnat June 15, 2 | 2010-06-15 |
| Method of testing a sequential access memory plane and a corresponding sequential access memory semiconductor device Grant 7,661,040 - Beaujoin , et al. February 9, 2 | 2010-02-09 |
| Scan test App 20070260953 - Armagnat; Paul | 2007-11-08 |
| Method for characterizing a bit detection event App 20070226595 - Le-Gall; Herve ; et al. | 2007-09-27 |
| Method of testing a sequential access memory plane and a corresponding sequential access memory semiconductor device App 20020138797 - Beaujoin, Marc ; et al. | 2002-09-26 |
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