Aritake; Toshiyuki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Aritake; Toshiyuki.The latest application filed is for "defect pattern evaluation method, defect pattern evaluation apparatus, and recording media".

Company Profile

0.4.6

Aritake; Toshiyuki - Mie JP
Aritake; Toshiyuki - Yokohama JP
ARITAKE; Toshiyuki - Nagahama JP
Aritake; Toshiyuki - Yokohama-shi JP
Aritake; Toshiyuki - Shiga JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Defect pattern evaluation method, defect pattern evaluation apparatus, and recording media Grant 9,202,763 - Miyoshi , et al. December 1, 2	2015-12-01
Defect Pattern Evaluation Method, Defect Pattern Evaluation Apparatus, And Recording Media App 20140199792 - MIYOSHI; Seiro ; et al.	2014-07-17
Failure detecting method, failure detecting apparatus, and semiconductor device manufacturing method Grant 8,170,707 - Matsushita , et al. May 1, 2	2012-05-01
Linear pattern detection method and apparatus Grant 8,081,814 - Matsushita , et al. December 20, 2	2011-12-20
Polylactic acid polymer compositon for thermoforming, polylactic acid polymer sheet for thermoforming, and thermoformed object obtained therefrom App 20090297652 - ARITAKE; Toshiyuki	2009-12-03
Linear Pattern Detection Method And Apparatus App 20090220142 - MATSUSHITA; Hiroshi ; et al.	2009-09-03
Failure Detecting Method, Failure Detecting Apparatus, And Semiconductor Device Manufacturing Method App 20090117673 - MATSUSHITA; Hiroshi ; et al.	2009-05-07
Aliphatic polyester film and packaging material Grant 7,390,558 - Aritake , et al. June 24, 2	2008-06-24
Aliphatic polyester films and packaging material App 20060177674 - Aritake; Toshiyuki ; et al.	2006-08-10
Polyactic acid polymer composition for thermoforming, polylactic acid polymer sheet for thermoforming, and thermoformed object obtained therefrom App 20060100395 - Aritake; Toshiyuki	2006-05-11

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