Arisaka; Yoshikazu

Patent Applications and Registrations

Patent applications and USPTO patent grants for Arisaka; Yoshikazu.The latest application filed is for "semiconductor substrate, manufacturing method of a semiconductor device and testing method of a semiconductor device".

Company Profile

0.8.12

Arisaka; Yoshikazu - Kawasaki JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Evaluation method of probe mark of probe needle of probe card using imaginary electrode pad and designated determination frame Grant 7,649,370 - Endou , et al. January 19, 2	2010-01-19
Contactor for electronic parts and a contact method Grant 7,471,096 - Kohashi , et al. December 30, 2	2008-12-30
Semiconductor substrate, manufacturing method of a semiconductor device and testing method of a semiconductor device App 20080227226 - Fujii; Shigeru ; et al.	2008-09-18
Semiconductor apparatus testing arrangement and semiconductor apparatus testing method Grant 7,355,421 - Maruyama , et al. April 8, 2	2008-04-08
Probe card, having cantilever-type probe and method Grant 7,256,591 - Tatematsu , et al. August 14, 2	2007-08-14
Evaluation method of probe mark of probe needle of probe card App 20070170937 - Endou; Yoshihiko ; et al.	2007-07-26
Probe card and method for manufacturing probe card App 20070134824 - Arisaka; Yoshikazu ; et al.	2007-06-14
Semiconductor apparatus testing arrangement and semiconductor apparatus testing method App 20070096761 - Maruyama; Shigeyuki ; et al.	2007-05-03
Probe card and method for manufacturing probe card Grant 7,180,312 - Arisaka , et al. February 20, 2	2007-02-20
Self-testing circuit in semiconductor memory device Grant 7,171,592 - Togashi , et al. January 30, 2	2007-01-30
Testing device and testing method of a semiconductor device Grant 7,129,726 - Tashiro , et al. October 31, 2	2006-10-31
Testing device and testing method of a semiconductor device App 20060220667 - Tashiro; Kazuhiro ; et al.	2006-10-05
Contactor for electronic parts and a contact method App 20060186905 - Kohashi; Naohito ; et al.	2006-08-24
Semiconductor substrate, manufacturing method of a semiconductor device and testing method of a semiconductor device App 20060097356 - Fujii; Shigeru ; et al.	2006-05-11
Semiconductor device provided with fuse and method of disconnecting fuse Grant 6,686,644 - Tatematsu , et al. February 3, 2	2004-02-03
Probe card and method for manufacturing probe card App 20030184330 - Arisaka, Yoshikazu ; et al.	2003-10-02
Self-testing circuit in semiconductor memory device App 20030177415 - Togashi, Kenji ; et al.	2003-09-18
Probe card, semiconductor device testing apparatus, and probe contact method App 20030098701 - Tatematsu, Tsutomu ; et al.	2003-05-29
Probe card and probe contact method App 20030098702 - Tatematsu, Tsutomu ; et al.	2003-05-29
Semiconductor device provided with fuse and method of disconnecting fuse App 20020153588 - Tatematsu, Tsutomu ; et al.	2002-10-24

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