Ariga; Akihiko

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ariga; Akihiko.The latest application filed is for "connection device and test system".

Company Profile

0.9.9

Ariga; Akihiko - Tokyo JP
Ariga; Akihiko - Musashimurayama JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Connection Device And Test System App 20090209053 - KASUKABE; Susumu ; et al.	2009-08-20
Connection device and test system Grant 7,541,202 - Kasukabe , et al. June 2, 2	2009-06-02
Connection Device And Test System App 20080009082 - Kasukabe; Susumu ; et al.	2008-01-10
Connection device and test system Grant 7,285,430 - Kasukabe , et al. October 23, 2	2007-10-23
Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step Grant 7,198,962 - Kohno , et al. April 3, 2	2007-04-03
Method of manufacturing semiconductor apparatus Grant 7,119,362 - Kono , et al. October 10, 2	2006-10-10
Connection device and test system App 20040235207 - Kasukabe, Susumu ; et al.	2004-11-25
Connection device and test system Grant 6,759,258 - Kasukabe , et al. July 6, 2	2004-07-06
Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step App 20030203521 - Kohno, Ryuji ; et al.	2003-10-30
Semiconductor device manufacturing method Grant 6,573,112 - Kono , et al. June 3, 2	2003-06-03
Method of manufacturing semiconductor apparatus App 20030092206 - Kono, Ryuji ; et al.	2003-05-15
Semiconductor device manufacturing method App 20030027365 - Kono, Ryuji ; et al.	2003-02-06
Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step App 20020182796 - Kohno, Ryuji ; et al.	2002-12-05
Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step Grant 6,455,335 - Kohno , et al. September 24, 2	2002-09-24
Method for manufacturing semiconductor device utilizing semiconductor testing equipment App 20020072136 - Kanamaru, Masatoshi ; et al.	2002-06-13
Semiconductor Device Manufacturing Method App 20020064893 - KONO, RYUJI ; et al.	2002-05-30
Connector and probing system Grant 6,305,230 - Kasukabe , et al. October 23, 2	2001-10-23
Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step Grant 6,197,603 - Kohno , et al. March 6, 2	2001-03-06

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