name:-0.010629892349243
name:-0.027676105499268
name:-0.001093864440918
ARIES ELECTRONICS, INC. Patent Filings

ARIES ELECTRONICS, INC.

Patent Applications and Registrations

Patent applications and USPTO patent grants for ARIES ELECTRONICS, INC..The latest application filed is for "open top burn in socket".

Company Profile
0.24.8
  • ARIES ELECTRONICS, INC. - Bristol PA
  • Aries Electronics, Inc. - Frenchtown NJ
  • ARIES ELECTRONICS, INC. -
  • Aries Electronics, Inc. - NJ
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Trademarks
Patent Activity
PatentDate
Open Top Burn In Socket
App 20120112780 - Groeger; Brian
2012-05-10
Test probe with hollow tubular contact with bullet-nosed configuration at one end and crimped configuration on other end
Grant 7,535,241 - Sinclair May 19, 2
2009-05-19
Integrated circuit test probe with hollow tubular contact configuration
App 20080100325 - Sinclair; William Y.
2008-05-01
Top loaded burn-in socket
Grant 7,210,951 - Sinclair May 1, 2
2007-05-01
Insulation displacement terminal
Grant D536,666 - Key February 13, 2
2007-02-13
Shielded semiconductor chip carrier having a high-density external interface
Grant 7,135,764 - Sinclair November 14, 2
2006-11-14
Top loaded burn-in socket
App 20060246758 - Sinclair; William Y.
2006-11-02
Top loaded burn-in socket
Grant 7,090,522 - Sinclair August 15, 2
2006-08-15
Top loaded burn-in socket
App 20060046531 - Sinclair; William Y.
2006-03-02
Method of creating gold contacts directly on printed circuit boards and product thereof
App 20050257953 - Walter, James P. ;   et al.
2005-11-24
Shielded integrated circuit probe
Grant 6,937,045 - Sinclair August 30, 2
2005-08-30
Shielded semiconductor chip carrier having a high-density external interface
App 20050030705 - Sinclair, William Y.
2005-02-10
Integrated circuit test probe
Grant 6,844,749 - Sinclair January 18, 2
2005-01-18
Shielded integrated circuit probe
App 20040232934 - Sinclair, William Y.
2004-11-25
Integrated circuit test probe
App 20040012402 - Sinclair, William Y.
2004-01-22
Universal production ball grid array socket
Grant 6,045,416 - Sinclair April 4, 2
2000-04-04
Universal production ball grid array socket
Grant 5,984,694 - Sinclair November 16, 1
1999-11-16
Universal production ball grid array socket
Grant 5,730,606 - Sinclair March 24, 1
1998-03-24
Housing for surface mountable device packages
Grant 5,729,147 - Schaff March 17, 1
1998-03-17
Resilient electrically conductive terminal assemblies
Grant 5,427,535 - Sinclair June 27, 1
1995-06-27
Printed circuit board electrical adaptor pin
Grant 5,410,452 - Sinclair , et al. April 25, 1
1995-04-25
Test socket assembly for testing LCC packages of both rectangular and square configuration
Grant 5,329,227 - Sinclair July 12, 1
1994-07-12
Electrical connector for ZIF PGA test socket
Grant 5,092,789 - Sinclair March 3, 1
1992-03-03
Zero insertion force pin grid array test socket
Grant 5,057,031 - Sinclair October 15, 1
1991-10-15
Method of making an electrical connector
Grant 4,793,058 - Venaleck * December 27, 1
1988-12-27
Ejector socket for DIP jumpers
Grant 4,531,795 - Sinclair July 30, 1
1985-07-30
IC Pin adjustment tool
Grant 4,470,289 - Sinclair , et al. September 11, 1
1984-09-11
Zero insertion force connector
Grant 4,402,563 - Sinclair September 6, 1
1983-09-06
Electrical connector for terminating a flat conductor cable
Grant 4,225,205 - Sinclair , et al. September 30, 1
1980-09-30
Socket for vertically mounting multi-pin device
Grant 4,200,347 - Sinclair , et al. April 29, 1
1980-04-29
Universally programmable shorting plug for an integrated circuit socket
Grant 4,090,667 - Crimmins May 23, 1
1978-05-23
Shorting plug for an integrating circuit socket
Grant 3,905,667 - Crimmins , et al. September 16, 1
1975-09-16
Company Registrations

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