Anzai; Yasuhito
Patent Applications and Registrations
Patent applications and USPTO patent grants for Anzai; Yasuhito.The latest application filed is for "method for inspecting semiconductor device".
- Anzai; Yasuhito - Tokyo JP
| Patent | Date |
|---|---|
| Method for inspecting semiconductor device Grant 7,829,355 - Anzai November 9, 2 | 2010-11-09 |
| Method For Inspecting Semiconductor Device App 20090042322 - Anzai; Yasuhito | 2009-02-12 |
| Multi chip package Grant 7,335,993 - Anzai February 26, 2 | 2008-02-26 |
| Substrate detector and method for detecting a substrate App 20060124873 - Anzai; Yasuhito | 2006-06-15 |
| Ball electrode forming method Grant 6,872,650 - Anzai March 29, 2 | 2005-03-29 |
| Ball electrode forming method App 20040053488 - Anzai, Yasuhito | 2004-03-18 |
| Multi chip package App 20040032016 - Anzai, Yasuhito | 2004-02-19 |
| Method of screening non-volatile memory devices Grant 6,639,860 - Anzai October 28, 2 | 2003-10-28 |
| Method Of Screening Non-volatile Memory Devices App 20030147294 - Anzai, Yasuhito | 2003-08-07 |
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