Anpo; Akihito

Patent Applications and Registrations

Patent applications and USPTO patent grants for Anpo; Akihito.The latest application filed is for "charged particle beam writing apparatus and irradiation time apportionment method of charged particle beams for multiple writing".

Company Profile

0.24.17

Anpo; Akihito - Machida JP
Anpo; Akihito - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Charged particle beam writing apparatus and charged particle beam writing method Grant RE47,707 - Kato , et al. No	2019-11-05
Charged particle beam lithography apparatus, inspection apparatus and inspection method of pattern writing data Grant 9,164,044 - Hara , et al. October 20, 2	2015-10-20
Charged particle beam writing apparatus and irradiation time apportionment method of charged particle beams for multiple writing Grant 9,141,750 - Yashima , et al. September 22, 2	2015-09-22
Charged particle beam writing apparatus and charged particle beam writing method using a generated frame that surrounds a first data processing block Grant 9,006,691 - Yashima , et al. April 14, 2	2015-04-14
Charged particle beam writing apparatus and charged particle beam writing method Grant 8,872,141 - Kato , et al. October 28, 2	2014-10-28
Charged particle beam writing method and apparatus therefor Grant 8,755,924 - Anpo June 17, 2	2014-06-17
Charged Particle Beam Writing Apparatus And Irradiation Time Apportionment Method Of Charged Particle Beams For Multiple Writing App 20140017349 - Yashima; Jun ; et al.	2014-01-16
Charged particle beam writing apparatus Grant 8,563,952 - Yashima , et al. October 22, 2	2013-10-22
Charged Particle Beam Lithography Apparatus, Inspection Apparatus And Inspection Method Of Pattern Writing Data App 20130264478 - HARA; Shigehiro ; et al.	2013-10-10
Charged Particle Beam Writing Apparatus And Charged Particle Beam Writing Method App 20130256519 - KATO; Yasuo ; et al.	2013-10-03
Charged particle beam pattern forming apparatus and charged particle beam pattern forming method Grant 8,502,175 - Nakayamada , et al. August 6, 2	2013-08-06
Charged particle beam writing method and apparatus therefor Grant 8,471,225 - Anpo June 25, 2	2013-06-25
Charged particle beam drawing apparatus and control method thereof Grant 8,466,440 - Yashima , et al. June 18, 2	2013-06-18
Charged Particle Beam Writing Apparatus And Charged Particle Beam Writing Method App 20120292536 - YASHIMA; Jun ; et al.	2012-11-22
Charged Particle Beam Writing Apparatus And Method Of Same App 20120292537 - YASHIMA; Jun ; et al.	2012-11-22
Write error verification method of writing apparatus and creation apparatus of write error verification data for writing apparatus Grant 8,307,314 - Anpo November 6, 2	2012-11-06
Charged particle beam drawing apparatus and proximity effect correction method thereof Grant 8,207,514 - Hara , et al. June 26, 2	2012-06-26
Charged particle beam drawing method and apparatus Grant 8,188,449 - Shibata , et al. May 29, 2	2012-05-29
Charged Particle Beam Pattern Forming Apparatus And Charged Particle Beam Pattern Forming Method App 20120007002 - NAKAYAMADA; Noriaki ; et al.	2012-01-12
Charged Particle Beam Drawing Apparatus And Control Method Thereof App 20120001097 - YASHIMA; Jun ; et al.	2012-01-05
Data verification method, charged particle beam writing apparatus, and computer-readable storage medium with program Grant 7,949,966 - Anpo , et al. May 24, 2	2011-05-24
Charged Particle Beam Drawing Apparatus And Proximity Effect Correction Method Thereof App 20110068281 - HARA; Shigehiro ; et al.	2011-03-24
Charged Particle Beam Writing Method And Apparatus Therefor App 20110066271 - Anpo; Akihito	2011-03-17
Charged Particle Beam Writing Method And Apparatus Therefor App 20110066272 - ANPO; Akihito	2011-03-17
Charged Particle Beam Drawing Method And Apparatus App 20110012031 - Shibata; Hayato ; et al.	2011-01-20
Write Error Verification Method Of Writing Apparatus And Creation Apparatus Of Write Error Verification Data For Writing Apparatus App 20100306721 - ANPO; Akihito	2010-12-02
Charged particle beam lithography apparatus and charged particle beam lithography method Grant 7,750,324 - Oogi , et al. July 6, 2	2010-07-06
Writing error verification method of pattern writing apparatus and generation apparatus of writing error verification data for pattern writing apparatus Grant 7,698,682 - Anpo , et al. April 13, 2	2010-04-13
Creation method and conversion method of charged particle beam writing data, and writing method of charged particle beam Grant 7,592,611 - Kasahara , et al. September 22, 2	2009-09-22
Method of forming pattern writing data by using charged particle beam Grant 7,504,645 - Anpo , et al. March 17, 2	2009-03-17
Charged Particle Beam Lithography Apparatus And Charged Particle Beam Lithography Method App 20090057575 - OOGI; Susumu ; et al.	2009-03-05
Data Verification Method, Charged Particle Beam Writing Apparatus, And Computer-readable Storage Medium With Program App 20080221816 - Anpo; Akihito ; et al.	2008-09-11
Writing Error Verification Method Of Pattern Writing Apparatus And Generation Apparatus Of Writing Error Verification Data For Pattern Writing Apparatus App 20080046787 - ANPO; Akihito ; et al.	2008-02-21
Method Of Forming Pattern Writing Data By Using Charged Particle Beam App 20070226675 - ANPO; Akihito ; et al.	2007-09-27
Creation Method And Conversion Method Of Charged Particle Beam Writing Data, And Writing Method Of Charged Particle Beam App 20070053242 - Kasahara; Jun ; et al.	2007-03-08

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.