loadpatents
name:-0.030616998672485
name:-0.015859127044678
name:-0.0098080635070801
Angelov; Ivelin Patent Filings

Angelov; Ivelin

Patent Applications and Registrations

Patent applications and USPTO patent grants for Angelov; Ivelin.The latest application filed is for "variable depth edge ring for etch uniformity control".

Company Profile
6.14.17
  • Angelov; Ivelin - San Jose CA
  • Angelov; Ivelin - Sunnyvale CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Variable depth edge ring for etch uniformity control
Grant 11,342,163 - Angelov , et al. May 24, 2
2022-05-24
Substrate processing chamber including multiple gas injection points and dual injector
Grant 10,825,659 - Treadwell , et al. November 3, 2
2020-11-03
Variable Depth Edge Ring For Etch Uniformity Control
App 20200273671 - ANGELOV; Ivelin ;   et al.
2020-08-27
Systems and methods for selectively etching film
Grant 10,727,089 - Caron , et al.
2020-07-28
Chamber member of a plasma source and pedestal with radially outward positioned lift pins for translation of a substrate c-ring
Grant 10,699,878 - Caron , et al.
2020-06-30
Variable depth edge ring for etch uniformity control
Grant 10,651,015 - Angelov , et al.
2020-05-12
Wafer lift ring system for wafer transfer
Grant 10,438,833 - Severson , et al. O
2019-10-08
System and method for increasing electron density levels in a plasma of a substrate processing system
Grant 10,147,588 - Eason , et al. De
2018-12-04
Ultrahigh Selective Nitride Etch To Form Finfet Devices
App 20180269070 - Eason; Kwame ;   et al.
2018-09-20
Control Of The Incidence Angle Of An Ion Beam On A Substrate
App 20170330788 - Angelov; Ivelin ;   et al.
2017-11-16
Control of the incidence angle of an ion beam on a substrate
Grant 9,812,349 - Angelov , et al. November 7, 2
2017-11-07
Method And Apparatus For Controlling Process Within Wafer Uniformity
App 20170278679 - Angelov; Ivelin ;   et al.
2017-09-28
System And Method For Increasing Electron Density Levels In A Plasma Of A Substrate Processing System
App 20170236694 - Eason; Kwame ;   et al.
2017-08-17
Systems And Methods For Selectively Etching Film
App 20170236731 - Caron; James Eugene ;   et al.
2017-08-17
Chamber Memeber Of A Plasma Source And Pedestal With Radially Outward Positioned Lift Pins For Translation Of A Substrate C-ring
App 20170236688 - Caron; James Eugene ;   et al.
2017-08-17
Wafer Lift Ring System For Wafer Transfer
App 20170236743 - Severson; Brian ;   et al.
2017-08-17
Variable Depth Edge Ring For Etch Uniformity Control
App 20170236741 - Angelov; Ivelin ;   et al.
2017-08-17
Substrate Processing Chamber Including Multiple Gas Injection Points And Dual Injector
App 20170200586 - Treadwell; Jason Lee ;   et al.
2017-07-13
Gas distribution device with actively cooled grid
Grant 9,679,749 - Angelov , et al. June 13, 2
2017-06-13
Control Of The Incidence Angle Of An Ion Beam On A Substrate
App 20170154804 - Angelov; Ivelin ;   et al.
2017-06-01
Selective Nitride Etch
App 20160181116 - Berry, III; Ivan L. ;   et al.
2016-06-23
Gas Distribution Device With Actively Cooled Grid
App 20160093472 - Angelov; Ivelin ;   et al.
2016-03-31
Pedestal covers
Grant 8,851,463 - Angelov , et al. October 7, 2
2014-10-07
Pedestal Covers
App 20130122431 - Angelov; Ivelin ;   et al.
2013-05-16
Pedestal covers
Grant 8,371,567 - Angelov , et al. February 12, 2
2013-02-12
Pedestal cover
Grant D671,901 - Angelov , et al. December 4, 2
2012-12-04
Pedestal Covers
App 20120264051 - Angelov; Ivelin ;   et al.
2012-10-18
Partial Contact Wafer Retaining Ring Apparatus
App 20100120335 - Fang; Haoquan ;   et al.
2010-05-13

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed