Ang; Boon Y.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ang; Boon Y..The latest application filed is for "method of testing a semiconductor structure".

Company Profile

2.12.1

Ang; Boon Y. - Sunnyvale CA
Ang; Boon Y. - Cupertino CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Mixed storage of data fields Grant 11,379,580 - Wesselkamper , et al. July 5, 2	2022-07-05
Test vehicle for package testing Grant 11,073,550 - Gong , et al. July 27, 2	2021-07-27
Systems and methods for on-die heat generation and temperature sensing Grant 10,620,644 - Parameswaran , et al.	2020-04-14
On-die temperature sensing and digitization system Grant 10,302,504 - Parameswaran , et al.	2019-05-28
Circuit for and method of testing bond connections between a first die and a second die Grant 10,262,911 - Gong , et al.	2019-04-16
Method of testing a semiconductor structure Grant 8,810,269 - Gong , et al. August 19, 2	2014-08-19
Method Of Testing A Semiconductor Structure App 20140091819 - Gong; Yuqing ; et al.	2014-04-03
Contact fuse one time programmable memory Grant 8,143,695 - Ang , et al. March 27, 2	2012-03-27
Electrically programmable diffusion fuse Grant 8,102,019 - Tumakha , et al. January 24, 2	2012-01-24
Method of fabricating CMOS-compatible non-volatile memory cell with lateral inter-poly programming layer Grant 7,839,693 - Paak , et al. November 23, 2	2010-11-23
Method and system for locating chip-level defects through emission imaging of a semiconductor device Grant 6,995,564 - Ang , et al. February 7, 2	2006-02-07
Method and apparatus for identifying individual die during failure analysis Grant 6,830,941 - Lee , et al. December 14, 2	2004-12-14
Method for revealing active regions in a SOI structure for DUT backside inspection Grant 6,770,495 - Ang , et al. August 3, 2	2004-08-03

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.