Andres; Michael

Patent Applications and Registrations

Patent applications and USPTO patent grants for Andres; Michael.The latest application filed is for "electric propulsion system having integrated electrical and thermal architecture and related methods of operating and implementing same".

Company Profile

5.27.18

Andres; Michael - Inver Grove Heights MN
Andres; Michael - Rockton IL
Andres; Michael - Sindelfingen DE
Andres; Michael - Holzgerlingen DE
Andres; Michael - Santa Clara CA
Andres; Michael - Rockford IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Integrated circuit contactor for testing ICs and method of construction Grant 11,209,458 - Nelson , et al. December 28, 2	2021-12-28
High isolation contactor with test pin and housing for integrated circuit testing Grant 11,183,783 - Sherry , et al. November 23, 2	2021-11-23
Electric Propulsion System Having Integrated Electrical and Thermal Architecture and Related Methods of Operating and Implementing Same App 20210344255 - Said; Waleed ; et al.	2021-11-04
Selectively geometric shaped contact pin for electronic component testing and method of fabrication Grant 11,029,335 - Johnson , et al. June 8, 2	2021-06-08
Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings Grant 10,928,423 - DeBauche , et al. February 23, 2	2021-02-23
Integrated Circuit Contactor For Testing ICs And Method Of Construction App 20200363451 - Nelson; John ; et al.	2020-11-19
High Isolation Contactor with Test Pin and Housing For Integrated Circuit Testing App 20200313322 - Sherry; Jeffrey ; et al.	2020-10-01
Integrated circuit contactor for testing ICs and method of construction Grant 10,725,069 - Nelson , et al.	2020-07-28
High isolation contactor with test pin and housing for integrated circuit testing Grant 10,686,269 - Sherry , et al.	2020-06-16
Low resistance low wear test pin for test contactor Grant 10,551,412 - Andres Fe	2020-02-04
On-center electrically conductive pins for integrated testing Grant 10,401,386 - Johnson , et al. Sep	2019-09-03
High Isolation Contactor with Test Pin and Housing For Integrated Circuit Testing App 20190097333 - Sherry; Jeffrey ; et al.	2019-03-28
Testing Apparatus And Method For Microcircuit Testing With Conical Bias Pad And Conductive Test Pin Rings App 20190004093 - DeBauche; John ; et al.	2019-01-03
Selectively geometric shaped contact pin for electronic component testing and method of fabrication Grant 10,114,039 - Johnson , et al. October 30, 2	2018-10-30
Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings Grant 10,067,164 - DeBauche , et al. September 4, 2	2018-09-04
Low Resistance Low Wear Test Pin For Test Contactor App 20180067145 - Andres; Michael	2018-03-08
Low resistance low wear test pin for test contactor Grant 9,804,194 - Andres October 31, 2	2017-10-31
Locating computer-controlled entities Grant 9,749,985 - Andres , et al. August 29, 2	2017-08-29
Testing apparatus and method for microcircuit and wafer level IC testing Grant 9,696,347 - DeBauche , et al. July 4, 2	2017-07-04
On-center electrically conductive pins for integrated testing Grant 9,638,714 - Johnson , et al. May 2, 2	2017-05-02
Testing Apparatus And Method For Microcircuit Testing With Conical Bias Pad And Conductive Test Pin Rings App 20170059616 - DeBauche; John ; et al.	2017-03-02
Low Resistance Low Wear Test Pin For Test Contactor App 20170023613 - Andres; Michael	2017-01-26
On-Center Electrically Conductive Pins For Integrated Testing App 20160370406 - Johnson; David ; et al.	2016-12-22
Locating Computer-controlled Entities App 20160302170 - ANDRES; Michael ; et al.	2016-10-13
On-center electrically conductive pins for integrated testing Grant 9,429,591 - Johnson , et al. August 30, 2	2016-08-30
Locating computer-controlled entities Grant 9,414,351 - Andres , et al. August 9, 2	2016-08-09
On-center electrically conductive pins for integrated testing Grant 9,341,649 - Johnson , et al. May 17, 2	2016-05-17
Low resistance low wear test pin for test contactor Grant 9,274,141 - Andres March 1, 2	2016-03-01
Locating Computer-controlled Entities App 20160050641 - ANDRES; Michael ; et al.	2016-02-18
Locating computer-controlled entities Grant 9,219,789 - Andres , et al. December 22, 2	2015-12-22
Locating Computer-controlled Entities App 20150215411 - ANDRES; Michael ; et al.	2015-07-30
Locating computer-controlled entities Grant 9,013,304 - Andres , et al. April 21, 2	2015-04-21
Testing Apparatus And Method For Microcircuit And Wafer Level Ic Testing App 20150015287 - DeBauche; John ; et al.	2015-01-15
On-Center Electrically Conductive Pins For Integrated Testing App 20150015293 - Johnson; David ; et al.	2015-01-15
Articulating contact pin Grant D719,923 - Johnson , et al. December 23, 2	2014-12-23
Laser cutting and chemical edge clean for thin-film solar cells Grant 8,728,933 - Andres , et al. May 20, 2	2014-05-20
Locating Computer-controlled Entities App 20110037610 - ANDRES; Michael ; et al.	2011-02-17
Dynamic reassignment of devices attached to redundant controllers Grant 7,882,389 - Andres , et al. February 1, 2	2011-02-01
Method And Apparatus For Fully Redundant Control Of Low-speed Peripherals App 20100185896 - Andres; Michael ; et al.	2010-07-22
Dynamic Reassignment Of Devices Attached To Redundant Controllers App 20100125682 - Andres; Michael ; et al.	2010-05-20
Coupling of peripherals to a computer system App 20050120145 - Andres, Michael ; et al.	2005-06-02
Backup bearing for magnetic bearings Grant 5,714,818 - Eakman , et al. February 3, 1	1998-02-03