Ando; Tohru

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ando; Tohru.The latest application filed is for "charged particle beam device enabling facilitated ebsd detector analysis of desired position and control method thereof".

Company Profile

0.20.19

Ando; Tohru - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for adjusting charged particle beam device and adjusting beam aperture based on a selected emission condition and charged particle beam device for same Grant 10,176,968 - Shigeto , et al. J	2019-01-08
Charged particle beam apparatus, specimen observation system and operation program Grant 9,792,832 - Konishi , et al. October 17, 2	2017-10-17
Charged particle beam device enabling facilitated EBSD detector analysis of desired position and control method thereof Grant 9,741,531 - Takeda , et al. August 22, 2	2017-08-22
Display screen with graphical user interface Grant D780,767 - Konishi , et al. March 7, 2	2017-03-07
Display screen with graphical user interface Grant D774,516 - Konishi , et al. December 20, 2	2016-12-20
Display screen with graphical user interface Grant D774,075 - Konishi , et al. December 13, 2	2016-12-13
Charged particle beam apparatus and program Grant 9,412,557 - Yamashita , et al. August 9, 2	2016-08-09
Charged Particle Beam Device Enabling Facilitated EBSD Detector Analysis of Desired Position and Control Method Thereof App 20160163504 - TAKEDA; Kazuyuki ; et al.	2016-06-09
Charged Particle Beam Device and Method for Adjusting Charged Particle Beam Device App 20160118218 - SHIGETO; Kunji ; et al.	2016-04-28
Charged Particle Beam Apparatus and Program App 20150325408 - YAMASHITA; Mitsugu ; et al.	2015-11-12
Charged particle beam apparatus Grant 9,129,773 - Ando , et al. September 8, 2	2015-09-08
Charged Particle Beam Apparatus App 20150144804 - Ando; Tohru ; et al.	2015-05-28
Charged Particle Beam Apparatus, Specimen Observation System And Operation Program App 20150074523 - Konishi; Yayoi ; et al.	2015-03-12
Inspection method and device Grant 8,754,664 - Nara , et al. June 17, 2	2014-06-17
Specimen Testing Device and Method for Creating Absorbed Current Image App 20130119999 - Obuki; Tomoharu ; et al.	2013-05-16
Specified position identifying method and specified position measuring apparatus Grant 8,442,300 - Tsuneta , et al. May 14, 2	2013-05-14
Inspection Method and Device App 20130112871 - Nara; Yasuhiko ; et al.	2013-05-09
Semiconductor inspection method and device that consider the effects of electron beams Grant 8,309,922 - Ando , et al. November 13, 2	2012-11-13
Specimen inspection equipment and how to make the electron beam absorbed current images Grant 8,178,840 - Obuki , et al. May 15, 2	2012-05-15
Logical CAD navigation for device characteristics evaluation system Grant 8,178,837 - Ando , et al. May 15, 2	2012-05-15
Semiconductor Inspection Method And Device That Consider The Effects Of Electron Beams App 20110291009 - Ando; Tohru ; et al.	2011-12-01
Method And Apparatus For Inspecting Semiconductor Using Absorbed Current Image App 20110291692 - Ando; Tohru ; et al.	2011-12-01
Semiconductor testing method and semiconductor tester Grant 8,067,752 - Ando , et al. November 29, 2	2011-11-29
Sample inspection apparatus Grant 7,989,766 - Nara , et al. August 2, 2	2011-08-02
Semiconductor Testing Method and Semiconductor Tester App 20100200749 - ANDO; Tohru ; et al.	2010-08-12
Logical Cad Navigation For Device Characteristics Evaluation System App 20100177954 - ANDO; Tohru ; et al.	2010-07-15
Semiconductor testing method and semiconductor tester Grant 7,732,791 - Ando , et al. June 8, 2	2010-06-08
Specimen Inspection Equipment and How to Make the Electron Beam Absorbed Current Images App 20100116986 - Obuki; Tomoharu ; et al.	2010-05-13
Logical CAD navigation for device characteristics evaluation system Grant 7,700,916 - Ando , et al. April 20, 2	2010-04-20
Specimen inspection equipment and how to make electron beam absorbed current images Grant 7,663,104 - Obuki , et al. February 16, 2	2010-02-16
Sample Inspection Apparatus App 20090250610 - NARA; Yasuhiko ; et al.	2009-10-08
Semiconductor Testing Method and Semiconductor Tester App 20080237462 - ANDO; Tohru ; et al.	2008-10-02
Specimen Inspection Equipment and How to Make the Electron Beam Absorbed Current Images App 20080203297 - OBUKI; Tomoharu ; et al.	2008-08-28
Specified position identifying method and specified position measuring apparatus App 20070274593 - Tsuneta; Ruriko ; et al.	2007-11-29
Logical CAD navigation for device characteristics evaluation system App 20070124713 - Ando; Tohru ; et al.	2007-05-31

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