loadpatents
name:-0.040705919265747
name:-0.04655385017395
name:-0.0055859088897705
Anand; Darren L. Patent Filings

Anand; Darren L.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Anand; Darren L..The latest application filed is for "charge trap memory devices".

Company Profile
4.44.36
  • Anand; Darren L. - Williston VT
  • Anand; Darren L. - Essex Junction VT
  • Anand; Darren L - Essex Junction VT
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Charge trap memory devices
Grant 11,367,734 - Khan , et al. June 21, 2
2022-06-21
Charge Trap Memory Devices
App 20210242230 - KHAN; Faraz ;   et al.
2021-08-05
Selection circuit
Grant 10,826,489 - Stormes , et al. November 3, 2
2020-11-03
Program and erase memory structures
Grant 10,685,705 - Khan , et al.
2020-06-16
Program And Erase Memory Structures
App 20200035295 - KHAN; Faraz ;   et al.
2020-01-30
Latching current sensing amplifier for memory array
Grant 10,535,379 - Anand , et al. Ja
2020-01-14
Robust and error free physical unclonable function using twin-cell charge trap transistor memory
Grant 10,468,104 - Anand , et al. No
2019-11-05
Margin test for multiple-time programmable memory (MTPM) with split wordlines
Grant 10,395,752 - Fifield , et al. A
2019-08-27
Margin Test For Multiple-time Programmable Memory (mtpm) With Split Wordlines
App 20190108894 - FIFIELD; John A. ;   et al.
2019-04-11
Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testing
Grant 10,163,526 - Fifield , et al. Dec
2018-12-25
Parallel programming of one time programmable memory array for reduced test time
Grant 10,062,445 - Hunt-Schroeder , et al. August 28, 2
2018-08-28
Circuit And Method For Detecting Time Dependent Dielectric Breakdown (tddb) Shorts And Signal-margin Testing
App 20180233216 - FIFIELD; John A. ;   et al.
2018-08-16
Parallel Programming Of One Time Programmable Memory Array For Reduced Test Time
App 20180158532 - HUNT-SCHROEDER; Eric D. ;   et al.
2018-06-07
Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testing
Grant 9,953,727 - Fifield , et al. April 24, 2
2018-04-24
Latching Current Sensing Amplifier For Memory Array
App 20170365302 - ANAND; Darren L. ;   et al.
2017-12-21
Latching current sensing amplifier for memory array
Grant 9,779,783 - Anand , et al. October 3, 2
2017-10-03
Latching Current Sensing Amplifier For Memory Array
App 20160372164 - ANAND; Darren L. ;   et al.
2016-12-22
Voltage-aware adaptive static random access memory (SRAM) write assist circuit
Grant 9,508,420 - Hunt-Schroeder , et al. November 29, 2
2016-11-29
Regulation For Multi-phase Voltage Pump System
App 20160181912 - Anand; Darren L. ;   et al.
2016-06-23
Refresh hidden eDRAM memory
Grant 9,281,045 - Anand , et al. March 8, 2
2016-03-08
Reference generator with programmable M and B parameters and methods of use
Grant 8,773,920 - Anand , et al. July 8, 2
2014-07-08
Multi-bank random access memory structure with global and local signal buffering for improved performance
Grant 8,649,239 - Anand , et al. February 11, 2
2014-02-11
Multi-bank Random Access Memory Structure With Global And Local Signal Buffering For Improved Performance
App 20130315022 - Anand; Darren L. ;   et al.
2013-11-28
Reference Generator With Programmable M And B Parameters And Methods Of Use
App 20130215686 - ANAND; Darren L. ;   et al.
2013-08-22
Fusebay controller structure, system, and method
Grant 8,484,543 - Anand , et al. July 9, 2
2013-07-09
Fusebay Controller Structure, System, And Method
App 20130042166 - Anand; Darren L. ;   et al.
2013-02-14
Morphing Memory Architecture
App 20120036315 - Reohr; William R. ;   et al.
2012-02-09
System and method for providing DRAM device-level repair via address remappings external to the device
Grant 7,984,329 - Lastras-Montano , et al. July 19, 2
2011-07-19
Delay circuit with delay equal to percentage of input pulse width
Grant 7,920,003 - Anand April 5, 2
2011-04-05
System and method for indicating status of an on-chip power supply system
Grant 7,917,806 - Anand , et al. March 29, 2
2011-03-29
Diagnostic method and apparatus for non-destructively observing latch data
Grant 7,916,826 - Anand , et al. March 29, 2
2011-03-29
Regulating electrical fuse programming current
Grant 7,911,820 - Anand , et al. March 22, 2
2011-03-22
Delay Circuit With Delay Equal To Percentage Of Input Pulse Width
App 20110063007 - Anand; Darren L.
2011-03-17
Regulating Electrical Fuse Programming Current
App 20100014373 - Anand; Darren L. ;   et al.
2010-01-21
Design structure for improving sensing margin of electrically programmable fuses
Grant 7,609,577 - Anand , et al. October 27, 2
2009-10-27
Diagnostic Method And Apparatus For Non-destructively Observing Latch Data
App 20090180584 - Anand; Darren L. ;   et al.
2009-07-16
System And Method For Indicating Status Of An On-chip Power Supply System
App 20090158092 - Anand; Darren L. ;   et al.
2009-06-18
Method for improving sensing margin of electrically programmable fuses
Grant 7,525,831 - Anand , et al. April 28, 2
2009-04-28
System And Method For Providing Dram Device-level Repair Via Address Remappings External To The Device
App 20090063896 - Lastras-Montano; Luis A. ;   et al.
2009-03-05
System and method for differential eFUSE sensing without reference fuses
Grant 7,477,555 - Anand , et al. January 13, 2
2009-01-13
Diagnostic method and apparatus for non-destructively observing latch data
Grant 7,453,973 - Anand , et al. November 18, 2
2008-11-18
Automatic bit fail mapping for embedded memories with clock multipliers
Grant 7,444,564 - Anand , et al. October 28, 2
2008-10-28
System for acquiring device parameters
Grant 7,382,149 - Anand , et al. June 3, 2
2008-06-03
Design Structure For Improving Sensing Margin Of Electrically Programmable Fuses
App 20080030260 - Anand; Darren L. ;   et al.
2008-02-07
Method For Improving Sensing Margin Of Electrically Programmable Fuses
App 20080025071 - Anand; Darren L. ;   et al.
2008-01-31
A System For Acquiring Device Parameters
App 20080018356 - Anand; Darren L ;   et al.
2008-01-24
System And Method For Differential Efuse Sensing Without Reference Fuses
App 20080002451 - Anand; Darren L. ;   et al.
2008-01-03
Circuitry and method for programming an electrically programmable fuse
Grant 7,315,193 - Anand , et al. January 1, 2
2008-01-01
Apparatus and method for improving sensing margin of electrically programmable fuses
Grant 7,307,911 - Anand , et al. December 11, 2
2007-12-11
Method for separating shift and scan paths on scan-only, single port LSSD latches
Grant 7,243,279 - Anand , et al. July 10, 2
2007-07-10
Circuitry And Method For Programming An Electrically Programmable Fuse
App 20070046361 - Anand; Darren L. ;   et al.
2007-03-01
Diagnostic Method and Apparatus For Non-Destructively Observing Latch Data
App 20070033458 - Anand; Darren L. ;   et al.
2007-02-08
Electronic fuse blow mimic and methods for adjusting electronic fuse blow
Grant 7,170,299 - Anand , et al. January 30, 2
2007-01-30
Diagnostic method and apparatus for non-destructively observing latch data
Grant 7,145,977 - Anand , et al. December 5, 2
2006-12-05
Method for reduced electrical fusing time
Grant 7,089,136 - Anand , et al. August 8, 2
2006-08-08
Fuse latch with compensated programmable resistive trip point
Grant 7,061,304 - Anand , et al. June 13, 2
2006-06-13
System and method for implementing self-timed decoded data paths in integrated circuits
Grant 6,995,585 - Anand , et al. February 7, 2
2006-02-07
Modular DLL architecture for generating multiple timings
Grant 6,956,415 - Anand , et al. October 18, 2
2005-10-18
Method and circuit for precise timing of signals in an embedded DRAM array
Grant 6,944,090 - Anand , et al. September 13, 2
2005-09-13
Fuse Latch With Compensated Programmable Resistive Trip Point
App 20050162799 - Anand, Darren L. ;   et al.
2005-07-28
Automatic Bit Fail Mapping For Embedded Memories With Clock Multipliers
App 20050120270 - Anand, Darren L. ;   et al.
2005-06-02
Modular Dll Architecture For Generating Multiple Timings
App 20050104639 - Anand, Darren L. ;   et al.
2005-05-19
System And Method For Implementing Self-timed Decoded Data Paths In Integrated Circuits
App 20050030065 - Anand, Darren L. ;   et al.
2005-02-10
Diagnostic Method And Apparatus For Non-destructively Observing Latch Data
App 20050025277 - Anand, Darren L. ;   et al.
2005-02-03
Method And Circuit For Precise Timing Of Signals In An Embedded Dram Array
App 20050007866 - Anand, Darren L. ;   et al.
2005-01-13
System and method for direct write to dynamic random access memory (DRAM) using PFET bit-switch
Grant 6,788,591 - Anand , et al. September 7, 2
2004-09-07
Method of electrically blowing fuses under control of an on-chip tester interface apparatus
Grant 6,768,694 - Anand , et al. July 27, 2
2004-07-27
Flexible multibanking interface for embedded memory applications
Grant 6,728,159 - Anand , et al. April 27, 2
2004-04-27
Method Of Electrically Blowing Fuses Under Control Of An On-chip Tester Interface Apparatus
App 20040066695 - Anand, Darren L. ;   et al.
2004-04-08
Flexible multibanking interface for embedded memory applications
App 20030123278 - Anand, Darren L. ;   et al.
2003-07-03
Method and apparatus for initializing an integrated circuit using compressed data from a remote fusebox
Grant 6,577,156 - Anand , et al. June 10, 2
2003-06-10
Column Redundancy System And Method For Embedded Dram Devices With Multibanking Capability
App 20030067816 - Anand, Darren L. ;   et al.
2003-04-10
Method and apparatus for initializing an integrated circuit using compressed data from a remote fusebox
App 20020101777 - Anand, Darren L. ;   et al.
2002-08-01
Method and apparatus for preventing postamble corruption within a memory system
Grant 5,978,281 - Anand , et al. November 2, 1
1999-11-02

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