Anan; Yoshihiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Anan; Yoshihiro.The latest application filed is for "substitution site measuring equipment and substitution site measuring method".

Company Profile

2.7.6

Anan; Yoshihiro - Tokyo JP
Anan; Yoshihiro - Kokubunji JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Substitution site measuring equipment and substitution site measuring method Grant 10,627,354 - Anan , et al.	2020-04-21
Substitution Site Measuring Equipment and Substitution Site Measuring Method App 20190017948 - ANAN; Yoshihiro ; et al.	2019-01-17
Charged-particle-beam analysis device and analysis method Grant 9,752,997 - Anan , et al. September 5, 2	2017-09-05
Spectroscopic element and charged particle beam device using the same Grant 9,601,308 - Anan , et al. March 21, 2	2017-03-21
Charged-particle-beam Analysis Device And Analysis Method App 20170067838 - ANAN; Yoshihiro ; et al.	2017-03-09
Spectroscopic Element And Charged Particle Beam Device Using The Same App 20150318144 - Anan; Yoshihiro ; et al.	2015-11-05
Charged particle beam analyzer and analysis method Grant 8,481,932 - Anan , et al. July 9, 2	2013-07-09
Charged Particle Beam Analyzer And Analysis Method App 20120257720 - ANAN; Yoshihiro ; et al.	2012-10-11
Apparatus and method for wafer pattern inspection Grant 7,982,188 - Shinada , et al. July 19, 2	2011-07-19
Apparatus and method for wafer pattern inspection App 20060249676 - Shinada; Hiroyuki ; et al.	2006-11-09
Apparatus and method for wafer pattern inspection Grant 7,022,986 - Shinada , et al. April 4, 2	2006-04-04
Apparatus and method for wafer pattern inspection App 20030127593 - Shinada, Hiroyuki ; et al.	2003-07-10

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