AN; Young Soo

Patent Applications and Registrations

Patent applications and USPTO patent grants for AN; Young Soo.The latest application filed is for "optical disc for fingerprint recognition sensor and optical filter comprising same".

Company Profile

0.15.22

AN; Young Soo - Yongin-si Gyeonggi-do KR
An; Young Soo - Seoul KR
An; Young-Soo - Yongin-si N/A KR
An; Young-Soo - Gyeonggi-do KR
An; Young-soo - Chungcheongnam-do KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Optical Disc For Fingerprint Recognition Sensor And Optical Filter Comprising Same App 20210280621 - CHOI; Jeong Og ; et al.	2021-09-09
Mobile terminal and display controlling method thereof Grant 8,866,810 - Cho , et al. October 21, 2	2014-10-21
Area-efficient data line layouts to suppress the degradation of electrical characteristics Grant 8,547,766 - Won , et al. October 1, 2	2013-10-01
Mobile terminal and video sharing method thereof Grant 8,347,216 - Shin , et al. January 1, 2	2013-01-01
Semiconductor Module And System Including The Same App 20120182653 - LEE; Joo-Han ; et al.	2012-07-19
Electrical signal transmission module, method of transmitting electric signals and electrical inspection apparatus having the same Grant 8,139,949 - Lee , et al. March 20, 2	2012-03-20
Semiconductor memory device Grant 8,130,577 - Won , et al. March 6, 2	2012-03-06
Interface structure of wafer test equipment Grant 8,026,733 - Lee , et al. September 27, 2	2011-09-27
Interposer and probe card having the same Grant 7,884,628 - An , et al. February 8, 2	2011-02-08
Wireless interface probe card for high speed one-shot wafer test and semiconductor testing apparatus having the same Grant 7,880,490 - Lee , et al. February 1, 2	2011-02-01
Mobile Terminal And Display Controlling Method Thereof App 20100315417 - CHO; Eun Woo ; et al.	2010-12-16
Data line layouts App 20100259963 - Won; Jong-Hak ; et al.	2010-10-14
Multilayer type test board assembly for high-precision inspection Grant 7,786,721 - Kim , et al. August 31, 2	2010-08-31
Apparatus for testing electrical characteristics App 20100176796 - Kim; Dong-dae ; et al.	2010-07-15
Semiconductor memory device App 20100118615 - Won; Jong-Hak ; et al.	2010-05-13
Interface structure of wafer test equipment App 20100117673 - Lee; Sang-hoon ; et al.	2010-05-13
Mobile Terminal And Video Sharing Method Thereof App 20100083137 - SHIN; Hyun-Bin ; et al.	2010-04-01
Probe card capable of multi-probing Grant 7,659,735 - Kim , et al. February 9, 2	2010-02-09
Interface device for wireless testing, semiconductor device and semiconductor package including the same, and method for wirelessly testing using the same App 20100025682 - Lee; Sang-Hoon ; et al.	2010-02-04
Interposer and a probe card assembly for electrical die sorting and methods of operating and manufacturing the same App 20090189624 - Oh; Se-Jang ; et al.	2009-07-30
Electrical test system including coaxial cables Grant 7,538,566 - An , et al. May 26, 2	2009-05-26
Interposer and probe card having the same App 20090102500 - An; Young-Soo ; et al.	2009-04-23
Wireless Interface Probe Card For High Speed One-shot Wafer Test And Semiconductor Testing Apparatus Having The Same App 20090066350 - LEE; Sang-Hoon ; et al.	2009-03-12
Electrical Signal Transmission Module, Method Of Transmitting Electric Signals And Electrical Inspection Apparatus Having The Same App 20090028571 - Lee; Sang-Hoon ; et al.	2009-01-29
Connector for testing a semiconductor package Grant 7,438,563 - Chung , et al. October 21, 2	2008-10-21
Multilayer type test board assembly for high-precision inspection App 20080164901 - Kim; Min-Gu ; et al.	2008-07-10
Probe card for test of semiconductor chips and method for test of semiconductor chips using the same App 20080164898 - Bae; Sung-Hoon ; et al.	2008-07-10
System and method for testing semiconductor integrated circuit in parallel App 20080164894 - Kim; Min-Gu ; et al.	2008-07-10
Electrical Test System Including Coaxial Cables App 20080100314 - AN; Young-soo ; et al.	2008-05-01
Photomasks including multi-layered light-shielding and methods of manufacturing the same App 20070166630 - Kim; Chang-Hwan ; et al.	2007-07-19
Probe card capable of multi-probing App 20070152688 - Kim; Min-gu ; et al.	2007-07-05
Connector for testing a semiconductor package App 20060121757 - Chung; Young-Bae ; et al.	2006-06-08
Contact-free test system for semiconductor device App 20060076965 - An; Young-Soo ; et al.	2006-04-13
Socket including pressure conductive rubber and mesh for testing of ball grid array package Grant 6,489,790 - An , et al. December 3, 2	2002-12-03
Socket Pin And Socket For Electrical Testing Of Semiconductor Packages App 20020011864 - AN, YOUNG-SOO ; et al.	2002-01-31

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