| Patent | Date |
|---|
Battery Module
App 20220085437 - JEON; Hae Ryong ; et al. | 2022-03-17 |
Battery Module
App 20220077519 - An; Sun Mo ; et al. | 2022-03-10 |
Battery Module
App 20210391609 - JEON; Hae Ryong ; et al. | 2021-12-16 |
Battery Module
App 20210359357 - CHUNG; Gyu Jin ; et al. | 2021-11-18 |
Battery module
Grant 11,101,508 - Chung , et al. August 24, 2 | 2021-08-24 |
Cell-seating Unit And Battery Module Comprising The Same
App 20210135175 - AN; Sun Mo ; et al. | 2021-05-06 |
Battery Module
App 20210135176 - AN; Sun Mo ; et al. | 2021-05-06 |
Battery Module
App 20210135179 - KANG; Ji Eun ; et al. | 2021-05-06 |
Battery System
App 20210135182 - Jeon; Hae Ryong ; et al. | 2021-05-06 |
Battery Module
App 20210098760 - Jeon; Hae Ryong ; et al. | 2021-04-01 |
Pouch-type Secondary Battery And Battery Module Including The Same
App 20200295313 - CHUNG; Gyu Jin ; et al. | 2020-09-17 |
Apparatus for diagnosing relay failure of battery using parallel circuit for constant power supply and method thereof
Grant 10,753,975 - Park , et al. A | 2020-08-25 |
Cartridge with mount frame having lead mounting board and lower and upper sliding boards and battery module having same
Grant 10,530,020 - Lee , et al. J | 2020-01-07 |
Battery Module
App 20200006823 - CHUNG; Gyu Jin ; et al. | 2020-01-02 |
Apparatus For Diagnosing Relay Failure Of Battery Using Parallel Circuit For Constant Power Supply And Method Thereof
App 20190128965 - PARK; Jong-Il ; et al. | 2019-05-02 |
Battery pack
Grant 10,056,600 - Lee , et al. August 21, 2 | 2018-08-21 |
Battery Cell, And Battery Module And Battery Pack Including Same
App 20180166667 - LIM; Seong-Yoon ; et al. | 2018-06-14 |
Battery module
Grant 9,935,346 - Lee , et al. April 3, 2 | 2018-04-03 |
Cartridge And Battery Module Having Same
App 20180048033 - LEE; Jeong-Seop ; et al. | 2018-02-15 |
Battery Pack
App 20160344013 - Lee; Chul Kyu ; et al. | 2016-11-24 |
Battery module equipped with sensing modules having improved coupling structure
Grant 9,412,993 - Kang , et al. August 9, 2 | 2016-08-09 |
Battery Module
App 20160197387 - LEE; Chul Kyu ; et al. | 2016-07-07 |
Semiconductor integrated circuit capable of controlling test modes without stopping test
Grant 9,368,237 - An , et al. June 14, 2 | 2016-06-14 |
Battery Module Equipped With Sensing Modules Having Improved Coupling Structure
App 20150140380 - KANG; Dal-Mo ; et al. | 2015-05-21 |
Semiconductor memory device and thermal code output circuit capable of correctly measuring thermal codes
Grant 8,542,548 - An September 24, 2 | 2013-09-24 |
Semiconductor memory apparatus
Grant 8,391,100 - An , et al. March 5, 2 | 2013-03-05 |
Self-refresh test circuit of semiconductor memory apparatus
Grant 8,259,527 - An , et al. September 4, 2 | 2012-09-04 |
Semiconductor memory apparatus and probe test control circuit therefor
Grant 8,248,874 - An August 21, 2 | 2012-08-21 |
Semiconductor Memory Apparatus
App 20110242929 - AN; Sun Mo ; et al. | 2011-10-06 |
Anti-fuse repair control circuit and semiconductor device including DRAM having the same
Grant 8,023,347 - Chu , et al. September 20, 2 | 2011-09-20 |
Fuse circuit for semiconductor integrated circuit and control method of the same
Grant 7,940,115 - An , et al. May 10, 2 | 2011-05-10 |
Multi-column decoder stress test circuit
Grant 7,940,585 - Chun , et al. May 10, 2 | 2011-05-10 |
Self-refresh Test Circuit Of Semiconductor Memory Apparatus
App 20110103165 - An; Sun Mo ; et al. | 2011-05-05 |
Address control circuit of semiconductor memory apparatus
Grant 7,920,437 - An April 5, 2 | 2011-04-05 |
Thermal code transmission circuit and semiconductor memory device using the same
Grant 7,864,613 - An , et al. January 4, 2 | 2011-01-04 |
Semiconductor Memory Apparatus And Probe Test Control Circuit Therefor
App 20100309739 - AN; Sun Mo | 2010-12-09 |
Address Control Circuit Of Semiconductor Memory Apparatus
App 20100265784 - An; Sun Mo | 2010-10-21 |
Wafer burn-in test circuit
Grant 7,800,964 - Kim , et al. September 21, 2 | 2010-09-21 |
Anti-fuse Repair Control Circuit And Semiconductor Device Including Dram Having The Same
App 20100142299 - CHU; Shin Ho ; et al. | 2010-06-10 |
Anti-fuse repair control circuit and semiconductor device including DRAM having the same
Grant 7,688,663 - Chu , et al. March 30, 2 | 2010-03-30 |
Semiconductor Integrated Circuit Capable Of Controlling Test Modes Without Stopping Test
App 20100032669 - AN; Sun Mo ; et al. | 2010-02-11 |
Thermal code output circuit and semiconductor memory device
App 20090268777 - An; Sun Mo | 2009-10-29 |
Semiconductor Integrated Circuit, Fuse Circuit For Semiconductor Integrated Circuit And Control Method Of The Same
App 20090230986 - An; Sun Mo ; et al. | 2009-09-17 |
Thermal code transmission circuit and semiconductor memory device using the same
App 20090168589 - An; Sun Mo ; et al. | 2009-07-02 |
Anti-fuse Repair Control Circuit And Semiconductor Device Including Dram Having The Same
App 20090141577 - Chu; Shin Ho ; et al. | 2009-06-04 |
Multi-column Decoder Stress Test Circuit
App 20090046524 - Chu; Shin-Ho ; et al. | 2009-02-19 |
Wafer Burn-in Test Circuit
App 20090046525 - Kim; Youk Hee ; et al. | 2009-02-19 |
Buffer
Grant 7,368,953 - Chu , et al. May 6, 2 | 2008-05-06 |
Buffer
App 20070080719 - Chu; Shin Ho ; et al. | 2007-04-12 |
Buffer
App 20070080722 - Chu; Shin Ho ; et al. | 2007-04-12 |
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