Amemiya; Takashi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Amemiya; Takashi.The latest application filed is for "probe card case and probe card transfer method".
- Amemiya; Takashi - Yamanashi JP
- Amemiya; Takashi - Nirasaki JP
- Amemiya; Takashi - Nirasaki City JP
- Amemiya; Takashi - Hyogo JP
- Amemiya; Takashi - Saga JP
- Amemiya; Takashi - Nirasaki-shi JP
- Amemiya; Takashi - Fujisawa JP
- Amemiya; Takashi - Fujisawa-shi JP
- Amemiya; Takashi - Kanagawa JP
- Amemiya; Takashi - Kawasaki JP
| Patent | Date |
|---|---|
| Probe card case and probe card transfer method Grant 10,908,180 - Mori , et al. February 2, 2 | 2021-02-02 |
| Probe card case and probe card transfer method Grant 10,184,954 - Mori , et al. Ja | 2019-01-22 |
| Substrate inspection apparatus and probe card transferring method Grant 9,671,452 - Amemiya June 6, 2 | 2017-06-06 |
| Probe Card Case And Probe Card Transfer Method App 20170153272 - Mori; Chikaomi ; et al. | 2017-06-01 |
| Probe card case Grant D751,555 - Mori , et al. March 15, 2 | 2016-03-15 |
| Probe Card Case And Probe Card Transfer Method App 20150285838 - Mori; Chikaomi ; et al. | 2015-10-08 |
| Substrate Inspection Apparatus And Probe Card Transferring Method App 20150192607 - Amemiya; Takashi | 2015-07-09 |
| Contact Terminal For A Probe Card, And The Probe Card App 20130099813 - HOSHINO; Tomohisa ; et al. | 2013-04-25 |
| Probing apparatus and method for adjusting probing apparatus Grant 8,063,652 - Amemiya , et al. November 22, 2 | 2011-11-22 |
| Inspection contact structure and probe card Grant 7,719,296 - Amemiya , et al. May 18, 2 | 2010-05-18 |
| Inspection contact structure and probe card Grant 7,701,234 - Amemiya , et al. April 20, 2 | 2010-04-20 |
| Probe card and probe device for inspection of a semiconductor device Grant 7,692,435 - Komatsu , et al. April 6, 2 | 2010-04-06 |
| Probe card for inspecting electric properties of an object Grant 7,679,385 - Amemiya , et al. March 16, 2 | 2010-03-16 |
| Epdm Composition App 20090171000 - Amemiya; Takashi ; et al. | 2009-07-02 |
| Probe card Grant 7,541,820 - Amemiya , et al. June 2, 2 | 2009-06-02 |
| Method Of Positioning An Anisotropic Conductive Connector, Method Of Positioning The Anisotropic Conductive Connector And A Circuit Board For Inspection, Anisotropic Conductive Connector, And Probe Card App 20090015281 - Yoshioka; Mutsuhiko ; et al. | 2009-01-15 |
| Inspection contact structure and probe card App 20080211523 - Amemiya; Takashi ; et al. | 2008-09-04 |
| Inspection contact structure and probe card App 20080211528 - Amemiya; Takashi ; et al. | 2008-09-04 |
| Probe Card App 20080150558 - Amemiya; Takashi ; et al. | 2008-06-26 |
| Probe Card App 20080048698 - Amemiya; Takashi ; et al. | 2008-02-28 |
| Probe card App 20080007280 - Amemiya; Takashi ; et al. | 2008-01-10 |
| Inspection contact structure and probe card Grant 7,267,551 - Amemiya , et al. September 11, 2 | 2007-09-11 |
| Probe card and probe device App 20070182431 - Komatsu; Shigekazu ; et al. | 2007-08-09 |
| Probing apparatus and method for adjusting probing apparatus App 20070108996 - Amemiya; Takashi ; et al. | 2007-05-17 |
| Fluororubber base sealant composition and fluororubber base sealant Grant 7,199,198 - Amemiya , et al. April 3, 2 | 2007-04-03 |
| Inspection contact structure and probe card App 20060154497 - Amemiya; Takashi ; et al. | 2006-07-13 |
| Fluororubber base sealant composition and fluororubber base sealant App 20060058450 - Amemiya; Takashi ; et al. | 2006-03-16 |
| Butyl rubber composition Grant 6,759,469 - Kudo , et al. July 6, 2 | 2004-07-06 |
| Butyl rubber composition App 20030088013 - Kudo, Masashi ; et al. | 2003-05-08 |
| Power generation plant including fuel cell Grant 5,248,567 - Amemiya , et al. September 28, 1 | 1993-09-28 |
| Fuel cell powerplant system Grant 5,178,969 - Amemiya January 12, 1 | 1993-01-12 |
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