loadpatents
name:-0.054019927978516
name:-0.031715869903564
name:-0.0022029876708984
Amemiya; Mitsuaki Patent Filings

Amemiya; Mitsuaki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Amemiya; Mitsuaki.The latest application filed is for "radiation detector and compton camera".

Company Profile
1.30.18
  • Amemiya; Mitsuaki - Saitama JP
  • Amemiya; Mitsuaki - Saitama-shi JP
  • Amemiya; Mitsuaki - Saitama-ken JP
  • Amemiya; Mitsuaki - Omiya JP
  • Amemiya; Mitsuaki - Oomiya JP
  • Amemiya; Mitsuaki - Utsunomiya JP
  • Amemiya, Mitsuaki - Oomiya-shi JP
  • Amemiya, Mitsuaki - Omiya-shi JP
  • Amemiya, Mitsuaki - Utsunomiya-shi JP
  • Amemiya; Mitsuaki - Atsugi JP
  • Amemiya; Mitsuaki - Isehara JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Radiation detector and compton camera
Grant 11,112,511 - Amemiya September 7, 2
2021-09-07
Radiation Detector And Compton Camera
App 20200033487 - Amemiya; Mitsuaki
2020-01-30
Radiation Detection Apparatus
App 20160341833 - Watanabe; Ikuo ;   et al.
2016-11-24
Target Device, Lithography Apparatus, And Article Manufacturing Method
App 20150318139 - Amemiya; Mitsuaki
2015-11-05
X-ray apparatus and its adjusting method
Grant 9,036,789 - Masaki , et al. May 19, 2
2015-05-19
Radiation imaging apparatus
Grant 9,020,098 - Tsukamoto , et al. April 28, 2
2015-04-28
X-ray optical apparatus
Grant 9,020,102 - Amemiya , et al. April 28, 2
2015-04-28
X-ray optical apparatus and adjusting method thereof
Grant 9,020,104 - Iizuka , et al. April 28, 2
2015-04-28
X-ray Optical Apparatus And Adjusting Method Thereof
App 20130243164 - Iizuka; Naoya ;   et al.
2013-09-19
X-ray Apparatus And Its Adjusting Method
App 20130243163 - Masaki; Fumitaro ;   et al.
2013-09-19
Radiation Imaging Apparatus
App 20130243156 - Tsukamoto; Takeo ;   et al.
2013-09-19
X-ray Optical Apparatus
App 20130235980 - Amemiya; Mitsuaki ;   et al.
2013-09-12
Filter exposure apparatus, and device manufacturing method
Grant 7,633,598 - Amemiya December 15, 2
2009-12-15
Measuring method, exposure apparatus, and device manufacturing method
Grant 7,465,936 - Amemiya December 16, 2
2008-12-16
Apparatus for evaluating EUV light source, and evaluation method using the same
Grant 7,312,459 - Amemiya , et al. December 25, 2
2007-12-25
Alignment apparatus, exposure apparatus and device fabrication method
Grant 7,271,875 - Amemiya , et al. September 18, 2
2007-09-18
Filter Exposure Apparatus, And Device Manufacturing Method
App 20070015067 - AMEMIYA; Mitsuaki
2007-01-18
Apparatus for evalulating EUV light source, and evaluation method using the same
App 20070002474 - Amemiya; Mitsuaki ;   et al.
2007-01-04
Measuring method, exposure apparatus, and device manufacturing method
App 20060186352 - Amemiya; Mitsuaki
2006-08-24
Apparatus and process for producing crystal article, and thermocouple used therein
Grant 7,014,707 - Amemiya March 21, 2
2006-03-21
Alignment apparatus, exposure apparatus and device fabrication method
App 20060044538 - Amemiya; Mitsuaki ;   et al.
2006-03-02
Measuring apparatus, exposure apparatus having the same, and device manufacturing method
App 20050270509 - Ogushi, Nobuaki ;   et al.
2005-12-08
X-ray exposure apparatus
Grant 6,647,086 - Amemiya , et al. November 11, 2
2003-11-11
Device manufacturing method
Grant 6,645,707 - Amemiya , et al. November 11, 2
2003-11-11
Exposure method
Grant 6,647,087 - Amemiya , et al. November 11, 2
2003-11-11
Alignment mark detection method, and alignment method, exposure method and device, and device production method, making use of the alignment mark detection method
Grant 6,642,528 - Amemiya , et al. November 4, 2
2003-11-04
Device Manufacturing Method
App 20030143496 - Amemiya, Mitsuaki ;   et al.
2003-07-31
Apparatus and process for producing crystal article, and thermocouple used therein
App 20030131789 - Amemiya, Mitsuaki
2003-07-17
Alignment mark detection method, and alignment method, exposure method and device, and device production method, making use of the alignment mark detection method
App 20020079462 - Amemiya, Mitsuaki ;   et al.
2002-06-27
Exposure method
App 20020025019 - Amemiya, Mitsuaki ;   et al.
2002-02-28
X-ray exposure apparatus
App 20020009176 - Amemiya, Mitsuaki ;   et al.
2002-01-24
X-ray exposure apparatus
App 20010043666 - Watanabe, Yutaka ;   et al.
2001-11-22
Alignment apparatus and SOR X-ray exposure apparatus having same
Grant 5,822,389 - Uzawa , et al. October 13, 1
1998-10-13
Process for holding an object
Grant 5,680,428 - Amemiya , et al. October 21, 1
1997-10-21
SOR exposure system and method of manufacturing semiconductor devices using same
Grant 5,581,590 - Mori , et al. December 3, 1
1996-12-03
Length-measuring device and exposure apparatus
Grant 5,440,394 - Nose , et al. August 8, 1
1995-08-08
Apparatus and process for vacuum-holding an object
Grant 5,329,126 - Amemiya , et al. July 12, 1
1994-07-12
X-ray lithography apparatus including a dose detectable mask
Grant 5,323,440 - Hara , et al. June 21, 1
1994-06-21
X-ray exposure apparatus
Grant 5,267,292 - Tanaka , et al. November 30, 1
1993-11-30
Wafer table and exposure apparatus with the same
Grant 5,231,291 - Amemiya , et al. July 27, 1
1993-07-27
X-ray exposure apparatus
Grant 5,172,403 - Tanaka , et al. December 15, 1
1992-12-15
X-ray transmitting window and method of mounting the same
Grant 5,159,621 - Watanabe , et al. October 27, 1
1992-10-27
Exposure apparatus for controlling intensity of exposure radiation
Grant 5,157,700 - Kurosawa , et al. October 20, 1
1992-10-20
Exposure apparatus
Grant 5,138,643 - Sakamoto , et al. August 11, 1
1992-08-11
Exposure method and apparatus
Grant 5,131,022 - Terashima , et al. July 14, 1
1992-07-14
Exposure apparatus with a substrate holding mechanism
Grant 5,093,579 - Amemiya , et al. March 3, 1
1992-03-03
X-ray exposure apparatus
Grant 4,935,947 - Amemiya June 19, 1
1990-06-19
Mask repair system
Grant 4,906,326 - Amemiya , et al. March 6, 1
1990-03-06

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