Ambikapathi; Arulmurugan

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ambikapathi; Arulmurugan.The latest application filed is for "method and system for evaluating efficiency of manual inspection for defect pattern".

Company Profile

11.5.7

Ambikapathi; Arulmurugan - New Taipei TW
AMBIKAPATHI; ARULMURUGAN - New Taipei City TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Automated optical inspection and classification apparatus based on a deep learning system and training apparatus thereof Grant 11,455,528 - Ambikapathi , et al. September 27, 2	2022-09-27
Defect inspection method, defect inspection device and defect inspection system Grant 11,017,259 - Ambikapathi , et al. May 25, 2	2021-05-25
Defect inspection system and method using artificial intelligence Grant 10,991,088 - Ambikapathi , et al. April 27, 2	2021-04-27
Automated optical inspection method using deep learning and apparatus, computer program for performing the method, computer-readable storage medium storing the computer program, and deep learning system thereof Grant 10,964,004 - Fang , et al. March 30, 2	2021-03-30
Method and system for evaluating efficiency of manual inspection for defect pattern Grant 10,878,559 - Tsou , et al. December 29, 2	2020-12-29
Labeling System And Method For Defect Classification App 20200003828 - AMBIKAPATHI; ARULMURUGAN ; et al.	2020-01-02
Optical Inspection Method, Optical Inspection Device And Optical Inspection System App 20200005070 - Ambikapathi; Arulmurugan ; et al.	2020-01-02
Method And System For Evaluating Efficiency Of Manual Inspection For Defect Pattern App 20200005446 - Tsou; Chia-Chun ; et al.	2020-01-02
Defect Inspection System And Method Using Artificil Intelligence App 20200005449 - AMBIKAPATHI; ARULMURUGAN ; et al.	2020-01-02
Automated Optical Inspection And Classification Apparatus Based On A Deep Learning System And Training Apparatus Thereof App 20200005141 - AMBIKAPATHI; ARULMURUGAN ; et al.	2020-01-02
Training Method Of, And Inspection System Based On, Iterative Deep Learning System App 20200005084 - AMBIKAPATHI; ARULMURUGAN ; et al.	2020-01-02
Automated Optical Inspection Method Using Deep Learning And Apparatus, Computer Program For Performing The Method, Computer-read App 20190197679 - FANG; Chih-Heng ; et al.	2019-06-27

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