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Patent applications and USPTO patent grants for Amanuma; Seiji.The latest application filed is for "test apparatus and test method".
Patent | Date |
---|---|
Test apparatus and test method Grant 9,222,966 - Amanuma December 29, 2 | 2015-12-29 |
Test apparatus Grant 9,057,756 - Amanuma June 16, 2 | 2015-06-16 |
Test apparatus and power supply apparatus Grant 8,427,182 - Amanuma April 23, 2 | 2013-04-23 |
Test Apparatus And Test Method App 20120217985 - Amanuma; Seiji | 2012-08-30 |
Test Apparatus App 20120153977 - AMANUMA; Seiji | 2012-06-21 |
Test Apparatus And Power Supply Apparatus App 20110128020 - AMANUMA; Seiji | 2011-06-02 |
Switching circuit, signal output device and test apparatus Grant 7,911,086 - Amanuma March 22, 2 | 2011-03-22 |
Switching circuit, signal output device and test apparatus Grant 7,880,470 - Amanuma February 1, 2 | 2011-02-01 |
Switching Circuit, Signal Output Device And Test Apparatus App 20100052435 - Amanuma; Seiji | 2010-03-04 |
Switching Circuit, Signal Output Device And Test Apparatus App 20100045115 - Amanuma; Seiji | 2010-02-25 |
Apparatus/method for measuring the switching time of output signals of a DUT Grant 7,550,976 - Amanuma June 23, 2 | 2009-06-23 |
Measurement apparatus, test apparatus, and measurement method Grant 7,518,377 - Amanuma , et al. April 14, 2 | 2009-04-14 |
Test apparatus and test method Grant 7,471,092 - Amanuma , et al. December 30, 2 | 2008-12-30 |
Switching Circuit, Signal Output Device And Test Apparatus App 20080238213 - AMANUMA; Seiji | 2008-10-02 |
Test apparatus and test method Grant 7,298,150 - Amanuma November 20, 2 | 2007-11-20 |
Measurement apparatus and measurement method App 20070210823 - Amanuma; Seiji | 2007-09-13 |
Test apparatus and test method App 20070194794 - Amanuma; Seiji | 2007-08-23 |
Measurement apparatus, test apparatus, and measurement method App 20070197168 - Amanuma; Seiji ;   et al. | 2007-08-23 |
Test Apparatus and test method App 20070194795 - Amanuma; Seiji ;   et al. | 2007-08-23 |
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