Amanullah; Ajharali

Patent Applications and Registrations

Patent applications and USPTO patent grants for Amanullah; Ajharali.The latest application filed is for "system and method for inspecting a wafer".

Company Profile

2.16.13

Amanullah; Ajharali - Singapore SG

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System and method for inspecting a wafer Grant 10,876,975 - Amanullah , et al. December 29, 2	2020-12-29
Method system for generating 3D composite images of objects and determining object properties based thereon Grant 10,504,761 - Amanullah Dec	2019-12-10
System And Method For Inspecting A Wafer App 20190033233 - AMANULLAH; Ajharali ; et al.	2019-01-31
System and method for inspecting a wafer Grant 10,161,881 - Amanullah , et al. Dec	2018-12-25
Method System For Generating 3d Composite Images Of Objects And Determining Object Properties Based Thereon App 20180226283 - AMANULLAH; Ajharali	2018-08-09
Systems and methods for automatically verifying correct die removal from film frames Grant 9,934,565 - Amanullah , et al. April 3, 2	2018-04-03
System and method for inspecting a wafer Grant 9,863,889 - Amanullah , et al. January 9, 2	2018-01-09
Apparatus and method for selectively inspecting component sidewalls Grant 9,816,938 - Amanullah November 14, 2	2017-11-14
System and method for capturing illumination reflected in multiple directions Grant 9,746,426 - Amanullah August 29, 2	2017-08-29
Systems And Methods For Automatically Verifying Correct Die Removal From Film Frames App 20160125583 - AMANULLAH; Ajharali ; et al.	2016-05-05
System and method for inspecting a wafer App 20150233840 - Amanullah; Ajharali ; et al.	2015-08-20
Apparatus And Method For Selectively Inspecting Component Sidewalls App 20150138341 - AMANULLAH; Ajharali	2015-05-21
System and method for inspecting a wafer Grant 8,885,918 - Amanullah , et al. November 11, 2	2014-11-11
Patterned wafer defect inspection system and method Grant 8,401,272 - Amanullah , et al. March 19, 2	2013-03-19
System and Method for Capturing Illumination Reflected in Multiple Directions App 20120013899 - Amanullah; Ajharali	2012-01-19
Multiple surface inspection system and method Grant 7,869,021 - Amanullah , et al. January 11, 2	2011-01-11
Multiple surface inspection system and method Grant 7,768,633 - Amanullah , et al. August 3, 2	2010-08-03
System and method for inspecting a wafer App 20100189339 - Amanullah; Ajharali ; et al.	2010-07-29
System and method for inspecting a wafer App 20100188486 - Amanullah; Ajharali ; et al.	2010-07-29
System and method for inspecting a wafer App 20100188499 - Amanullah; Ajharali ; et al.	2010-07-29
Multiple Surface Inspection System and Method App 20090073426 - Amanullah; Ajharali ; et al.	2009-03-19
Patterned wafer defect inspection system and method App 20090034831 - Amanullah; Ajharali ; et al.	2009-02-05
Multiple surface inspection system and method App 20080246958 - Amanullah; Ajharali ; et al.	2008-10-09

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