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Patent applications and USPTO patent grants for Alyamani; Ahmad A..The latest application filed is for "methods for using checksums in x-tolerant test response compaction in scan-based testing of integrated circuits".
Patent | Date |
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Methods for using checksums in X-tolerant test response compaction in scan-based testing of integrated circuits Grant 7,328,386 - Grinchuk , et al. February 5, 2 | 2008-02-05 |
Segmented addressable scan architecture and method for implementing scan-based testing of integrated circuits Grant 7,206,983 - Alyamani , et al. April 17, 2 | 2007-04-17 |
Methods for using checksums in X-tolerant test response compaction in scan-based testing of integrated circuits App 20060282728 - Grinchuk; Mikhail I. ;   et al. | 2006-12-14 |
Segmented addressable scan architecture and method for implementing scan-based testing of integrated circuits App 20060236176 - Alyamani; Ahmad A. ;   et al. | 2006-10-19 |
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