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Patent applications and USPTO patent grants for Alumot; Dror.The latest application filed is for "accuracy improvements in optical metrology".
Patent | Date |
---|---|
Device metrology targets and methods Grant 11,054,752 - Amit , et al. July 6, 2 | 2021-07-06 |
Accuracy Improvements In Optical Metrology App 20210175132 - Bringoltz; Barak ;   et al. | 2021-06-10 |
Examination of a semiconductor specimen Grant 11,022,566 - Alumot , et al. June 1, 2 | 2021-06-01 |
Device metrology targets and methods Grant 10,571,811 - Amit , et al. Feb | 2020-02-25 |
Overlay control with non-zero offset prediction Grant 10,409,171 - Adel , et al. Sept | 2019-09-10 |
Device Metrology Targets And Methods App 20190004438 - Amit; Eran ;   et al. | 2019-01-03 |
Overlay Control with Non-Zero Offset Prediction App 20180253017 - Adel; Michael E. ;   et al. | 2018-09-06 |
Accuracy Improvements In Optical Metrology App 20180047646 - Bringoltz; Barak ;   et al. | 2018-02-15 |
Device Metrology Targets And Methods App 20160266505 - Amit; Eran ;   et al. | 2016-09-15 |
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