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Patent applications and USPTO patent grants for Alumot; David.The latest application filed is for "optical inspection apparatus for substrate defect detection".
Patent | Date |
---|---|
Optical inspection apparatus for substrate defect detection Grant 7,796,807 - Alumot , et al. September 14, 2 | 2010-09-14 |
Optical Inspection Apparatus For Substrate Defect Detection App 20090148033 - Alumot; David ;   et al. | 2009-06-11 |
Optical inspection method for substrate defect detection Grant 7,499,583 - Alumot , et al. March 3, 2 | 2009-03-03 |
Optical inspection apparatus for substrate defect detection Grant 6,952,491 - Alumot , et al. October 4, 2 | 2005-10-04 |
Optical inspection apparatus for substrate defect detection App 20040263834 - Alumot, David ;   et al. | 2004-12-30 |
Optical inspection method for substrate defect detection App 20040218807 - Alumot, David ;   et al. | 2004-11-04 |
Optical inspection apparatus for defect detection App 20020039436 - Alumot, David ;   et al. | 2002-04-04 |
Substrate inspection method and apparatus Grant 6,178,257 - Alumot , et al. January 23, 2 | 2001-01-23 |
Optical inspection method and apparatus Grant 5,982,921 - Alumot , et al. November 9, 1 | 1999-11-09 |
Two-phase optical inspection method and apparatus for defect detection Grant 5,699,447 - Alumot , et al. December 16, 1 | 1997-12-16 |
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