Albertson; Todd P.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Albertson; Todd P..The latest application filed is for "probe head and electronic device testing system".

Company Profile

4.24.32

Albertson; Todd P. - Warren OR
Albertson; Todd P. - Chandler AZ
Albertson; Todd P - Warren OR US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Probe pins with etched tips for electrical die test Grant 11,340,258 - Stanford , et al. May 24, 2	2022-05-24
Probe head and electronic device testing system Grant 11,112,430 - Kaza , et al. September 7, 2	2021-09-07
Probe Head And Electronic Device Testing System App 20200309818 - Kaza; Anil ; et al.	2020-10-01
Probe Pins With Etched Tips For Electrical Die Test App 20200209280 - Stanford; Joseph D. ; et al.	2020-07-02
Probe pins with etched tips for electrical die test Grant 10,598,696 - Stanford , et al.	2020-03-24
Etching for probe wire tips for microelectronic device test Grant 9,977,054 - Albertson , et al. May 22, 2	2018-05-22
Probe tip formation for die sort and test Grant 9,823,273 - Martin , et al. November 21, 2	2017-11-21
Probe Pins With Etched Tips For Electrical Die Test App 20170276700 - Stanford; Joseph D. ; et al.	2017-09-28
Organic space transformer attachment and assembly Grant 9,581,639 - Yang , et al. February 28, 2	2017-02-28
Anti-rotation for wire probes in a probe head of a die tester Grant 9,535,095 - Shia , et al. January 3, 2	2017-01-03
Etching For Probe Wire Tips For Microelectronic Device Test App 20160363613 - ALBERTSON; TODD P. ; et al.	2016-12-15
Composite Wire Probe Test Assembly App 20160274148 - Stevenson; Kip ; et al.	2016-09-22
Formed Wire Probe Interconnect For Test Die Contactor App 20160178663 - Prabhugoud; Mohanraj ; et al.	2016-06-23
Composite wire probe test assembly Grant 9,354,273 - Stevenson , et al. May 31, 2	2016-05-31
Mechanism for facilitating modular processing cell framework and application for asynchronous parallel singulated semiconductor device handling and testing Grant 9,279,854 - Johnson , et al. March 8, 2	2016-03-08
Micro positioning test socket and methods for active precision alignment and co-planarity feedback Grant 9,255,945 - Detofsky , et al. February 9, 2	2016-02-09
Composite wire probes for testing integrated circuits Grant 9,207,258 - Shia , et al. December 8, 2	2015-12-08
Sort probe gripper Grant 9,134,343 - Shia , et al. September 15, 2	2015-09-15
Organic Space Transformer Attachment And Assembly App 20150185252 - YANG; Jin ; et al.	2015-07-02
Wire probe assembly and forming process for die testing Grant 9,069,014 - Albertson , et al. June 30, 2	2015-06-30
Anti-rotation For Wire Probes In A Probe Head Of A Die Tester App 20150061713 - Shia; David ; et al.	2015-03-05
Probe Tip Formation For Die Sort And Test App 20150002181 - Martin; Keith J. ; et al.	2015-01-01
Thermal interface for multi-chip packages Grant 8,891,235 - Walczyk , et al. November 18, 2	2014-11-18
Micro Positioning Test Socket And Methods For Active Precision Alignment And Co-planarity Feedback App 20140218061 - Detofsky; Abram M. ; et al.	2014-08-07
Mechanism For Facilitating Modular Processing Cell Framework And Application For Asynchronous Parallel Singulated Semiconductor Device Handling And Testing App 20140184255 - JOHNSON; JOHN C. ; et al.	2014-07-03
Composite Wire Probe Test Assembly App 20140176172 - Stevenson; Kip ; et al.	2014-06-26
Micro positioning test socket and methods for active precision alignment and co-planarity feedback Grant 8,710,858 - Detofsky , et al. April 29, 2	2014-04-29
Sort Probe Gripper App 20140091828 - Shia; David ; et al.	2014-04-03
Composite Wire Probes For Testing Integrated Circuits App 20140091821 - Shia; David ; et al.	2014-04-03
Thermal Interface For Multi-chip Packages App 20140002994 - Walczyk; Joseph F. ; et al.	2014-01-02
Wire Probe Assembly and Forming Process for Die Testing App 20140002124 - Albertson; Todd P. ; et al.	2014-01-02
Apparatus And Method For Automated Sort Probe Assembly And Repair App 20130269173 - Albertson; Todd P. ; et al.	2013-10-17
Micro Positioning Test Socket And Methods For Active Precision Alignment And Co-planarity Feedback App 20120074975 - Detofsky; Abram M. ; et al.	2012-03-29
Temperature and voltage controlled integrated circuit processes Grant 7,345,495 - Dangelo , et al. March 18, 2	2008-03-18
Temperature and voltage controlled integrated circuit processes App 20060002161 - Dangelo; Daniel J. ; et al.	2006-01-05

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