Akutsu; Haruko

Patent Applications and Registrations

Patent applications and USPTO patent grants for Akutsu; Haruko.The latest application filed is for "atom probe inspection device, field ion microscope, and distortion correction method".

Company Profile

2.13.19

Akutsu; Haruko - Yokosuka JP
Akutsu; Haruko - Kanagawa JP
AKUTSU; Haruko - Yokosuka-Shi JP
Akutsu; Haruko - Yokohama JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Mass spectrometer and mass spectrometry method Grant 11,062,894 - Saito , et al. July 13, 2	2021-07-13
Atom probe inspection device, field ion microscope, and distortion correction method Grant 10,916,405 - Ikeda , et al. February 9, 2	2021-02-09
Atom Probe Inspection Device, Field Ion Microscope, And Distortion Correction Method App 20200286711 - IKEDA; Takahiro ; et al.	2020-09-10
Mass spectrometer performing mass spectrometry for sample with laser irradiation Grant 10,553,416 - Akutsu , et al. Fe	2020-02-04
Mass Spectrometer And Mass Spectrometry Method App 20190341242 - SAITO; Reiko ; et al.	2019-11-07
Scanning probe microscope and measurement method using the same Grant 10,345,336 - Hirota , et al. July 9, 2	2019-07-09
Scanning Probe Microscope And Measurement Method Using The Same App 20170269123 - HIROTA; Jun ; et al.	2017-09-21
Analytical apparatus, sample holder and analytical method Grant 9,734,985 - Akutsu , et al. August 15, 2	2017-08-15
Mass Spectrometer App 20170076930 - AKUTSU; Haruko ; et al.	2017-03-16
Analytical Apparatus, Sample Holder And Analytical Method App 20170004954 - AKUTSU; Haruko ; et al.	2017-01-05
Sputter neutral particle mass spectrometry apparatus with optical element Grant 9,431,229 - Yorisaki , et al. August 30, 2	2016-08-30
Material inspection apparatus and material inspection method Grant 9,287,104 - Akutsu March 15, 2	2016-03-15
Mass Spectroscope And Mass Spectrometry App 20150279645 - AKUTSU; Haruko	2015-10-01
Sputter Neutral Particle Mass Spectrometry Apparatus App 20150270113 - YORISAKI; Toma ; et al.	2015-09-24
Material Inspection Apparatus And Material Inspection Method App 20150048244 - AKUTSU; Haruko	2015-02-19
Material Inspection Apparatus App 20150041652 - AKUTSU; Haruko	2015-02-12
Sample Analysis Apparatus, Non-transitory Computer-readable Recording Medium And Sample Analysis Method App 20150012229 - SHISHIDO; Masayuki ; et al.	2015-01-08
Sample structure analyzing method, transmission electron microscope, and computer-readable non-transitory recording medium Grant 8,841,614 - Murakami , et al. September 23, 2	2014-09-23
Sample analyzing apparatus and sample analyzing method Grant 8,748,844 - Akutsu June 10, 2	2014-06-10
Atom Probe Measuring Apparatus And Method App 20140070110 - KITAMOTO; Katsuyuki ; et al.	2014-03-13
Sample Analyzing Apparatus And Sample Analyzing Method App 20130248706 - AKUTSU; Haruko	2013-09-26
Method Of Cleaning Mask And Mask Cleaning Apparatus App 20110100393 - UEMURA; Eri ; et al.	2011-05-05
Semiconductor Device Fabrication Mask And Method Of Manufacturing The Same App 20110053058 - OTSUBO; Kyo ; et al.	2011-03-03
Semiconductor Device And Method Of Fabricating The Same App 20090243002 - SONEHARA; Takeshi ; et al.	2009-10-01
Method of manufacture of semiconductor device Grant 7,557,040 - Itokawa , et al. July 7, 2	2009-07-07
Semiconductor device and method for manufacturing the same Grant 7,495,293 - Iinuma , et al. February 24, 2	2009-02-24
Method of manufacture of semiconductor device App 20070166977 - Itokawa; Hiroshi ; et al.	2007-07-19
Semiconductor device and method for manufacturing the same App 20070052039 - Iinuma; Toshihiko ; et al.	2007-03-08
Apparatus and method for evaluating semiconductor material Grant 7,145,658 - Akutsu , et al. December 5, 2	2006-12-05
Apparatus and method for evaluating semiconductor material App 20040196464 - Akutsu, Haruko ; et al.	2004-10-07

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