Akopyan; Mikhail

Patent Applications and Registrations

Patent applications and USPTO patent grants for Akopyan; Mikhail.The latest application filed is for "system and method for determining 3d surface features and irregularities on an object".

Company Profile

2.8.6

Akopyan; Mikhail - Sudbury MA
Akopyan; Mikhail - Natick MA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System And Method For Determining 3d Surface Features And Irregularities On An Object App 20220180499 - Akopyan; Mikhail ; et al.	2022-06-09
System and method for determining 3D surface features and irregularities on an object Grant 11,176,655 - Akopyan , et al. November 16, 2	2021-11-16
System and method for efficient surface measurement using a laser displacement sensor Grant 10,775,160 - Wolff , et al. September 15, 2	2020-09-15
System And Method For Efficient Surface Measurement Using A Laser Displacement Sensor App 20190265027 - Wolff; Robert A. ; et al.	2019-08-29
System and method for determination of object volume with multiple three-dimensional sensors Grant 10,074,191 - Reome , et al. September 11, 2	2018-09-11
System and method for efficient surface measurement using a laser displacement sensor Grant 10,041,786 - Wolff , et al. August 7, 2	2018-08-07
System And Method For Efficient Surface Measurement Using A Laser Displacement Sensor App 20170299380 - Wolff; Robert A. ; et al.	2017-10-19
System and method for efficient surface measurement using a laser displacement sensor Grant 9,605,950 - Wolff , et al. March 28, 2	2017-03-28
System and method for capturing and detecting symbology features and parameters Grant 9,189,670 - Moed , et al. November 17, 2	2015-11-17
System And Method For Determining 3d Surface Features And Irregularities On An Object App 20150213606 - Akopyan; Mikhail ; et al.	2015-07-30
System And Method For Efficient Surface Measurement Using A Laser Displacement Sensor App 20140347473 - Wolff; Robert A. ; et al.	2014-11-27
System And Method For Capturing And Detecting Symbology Features And Parameters App 20100200660 - Moed; Michael C. ; et al.	2010-08-12
Method and apparatus for inspecting distorted patterns Grant 6,973,207 - Akopyan , et al. December 6, 2	2005-12-06

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