| Patent | Date |
|---|
Image processing device, image processing method, and program recording medium
Grant 11,341,739 - Akiyama May 24, 2 | 2022-05-24 |
Image Processing Device, Image Processing Method, And Program Recording Medium
App 20210182587 - AKIYAMA; Tatsuo | 2021-06-17 |
Object Tracking Device, Object Tracking Method, And Object Tracking Program
App 20210004967 - AKIYAMA; Tatsuo | 2021-01-07 |
Object tracking device, object tracking method, and recording medium
Grant 10,867,394 - Akiyama December 15, 2 | 2020-12-15 |
Object Tracking Device, Object Tracking Method, And Recording Medium
App 20190156491 - AKIYAMA; Tatsuo | 2019-05-23 |
Management system, list production device, method, computer readable recording medium, data structure, and printed label
Grant 9,836,665 - Akiyama , et al. December 5, 2 | 2017-12-05 |
Information processing device, information processing method and information processing program
Grant 9,830,336 - Akiyama , et al. November 28, 2 | 2017-11-28 |
Management System, List Production Device, Method, Computer Readable Recording Medium, Data Structure, And Printed Label
App 20160275368 - AKIYAMA; Tatsuo ; et al. | 2016-09-22 |
Feature point matching device, feature point matching method, and non-transitory computer readable medium storing feature matching program
Grant 9,430,711 - Akiyama August 30, 2 | 2016-08-30 |
Information Processing Device, Information Processing Method And Information Processing Program
App 20150278249 - Akiyama; Tatsuo ; et al. | 2015-10-01 |
Shot Image Processing System, Shot Image Processing Method, Mobile Terminal, And Information Processing Apparatus
App 20140044377 - Yachida; Shoji ; et al. | 2014-02-13 |
Feature Point Matching Device, Feature Point Matching Method, And Non-transitory Computer Readable Medium Storing Feature Matching Program
App 20130315490 - Akiyama; Tatsuo | 2013-11-28 |
Document retrieval of feature point groups using a geometrical transformation
Grant 8,520,981 - Akiyama August 27, 2 | 2013-08-27 |
Image Comparison Device, Image Comparison Method, Image Comparison System, Server, Terminal, Terminal Control Method, And Terminal Control Program
App 20130208990 - Akiyama; Tatsuo ; et al. | 2013-08-15 |
Moving amount calculation system and obstacle detection system
Grant 8,199,970 - Akiyama June 12, 2 | 2012-06-12 |
Feature Point Arrangement Checking Device, Image Checking Device, Method Therefor, And Program
App 20100239172 - Akiyama; Tatsuo | 2010-09-23 |
Semiconductor device manufacturing system and method for manufacturing semiconductor devices including calculating oxide film thickness using real time simulator
Grant 7,702,413 - Ushiku , et al. April 20, 2 | 2010-04-20 |
Moving Amount Calculation System and Obstacle Detection System
App 20090154770 - Akiyama; Tatsuo | 2009-06-18 |
Method for designing a manufacturing process, method for providing manufacturing process design and technology computer-aided design system
Grant 7,272,460 - Akiyama , et al. September 18, 2 | 2007-09-18 |
Method for designing a manufacturing process, method for providing manufacturing process design and technology computer-aided design system
App 20050113951 - Akiyama, Tatsuo ; et al. | 2005-05-26 |
Semiconductor device manufacturing system and method for manufacturing semiconductor devices
App 20050095774 - Ushiku, Yukihiro ; et al. | 2005-05-05 |
Semiconductor design/fabrication system, semiconductor design/fabrication method and semiconductor design/fabrication program
Grant 6,775,816 - Sato , et al. August 10, 2 | 2004-08-10 |
Method of evaluating critical locations on a semiconductor apparatus pattern
Grant 6,657,735 - Noda , et al. December 2, 2 | 2003-12-02 |
Semiconductor design/fabrication system, semiconductor design/fabrication method and semiconductor design/fabrication program
App 20030121016 - Sato, Yoshiyuki ; et al. | 2003-06-26 |
Dangerous process/pattern detection system and method, danger detection program, and semiconductor device manufacturing method
App 20030014146 - Fujii, Osamu ; et al. | 2003-01-16 |
Mas trading system and method
App 20020138404 - Akiyama, Tatsuo ; et al. | 2002-09-26 |
Method of evaluating critical locations on a semiconductor apparatus pattern
App 20020030187 - Noda, Tomonobu ; et al. | 2002-03-14 |
Polishing method and apparatus for detecting a polishing end point of a semiconductor wafer
Grant 5,643,046 - Katakabe , et al. July 1, 1 | 1997-07-01 |
Field effect transistor using compound semiconductor
Grant 5,374,835 - Shimada , et al. December 20, 1 | 1994-12-20 |
Method for manufacturing a semiconductor device with Schottky electrodes
Grant 5,229,323 - Shimada , et al. July 20, 1 | 1993-07-20 |
GaAs field effect semiconductor device having Schottky gate structure
Grant 5,049,954 - Shimada , et al. September 17, 1 | 1991-09-17 |
Composite semiconductor device
Grant 4,710,794 - Koshino , et al. December 1, 1 | 1987-12-01 |
Method of fabricating Schottky gate-type GaAs field effect transistor
Grant 4,700,455 - Shimada , et al. October 20, 1 | 1987-10-20 |
Method of manufacturing a semiconductor device
Grant 4,532,004 - Akiyama , et al. July 30, 1 | 1985-07-30 |
Ion selective field-effect sensor
Grant 4,352,726 - Sugano , et al. October 5, 1 | 1982-10-05 |
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