Akiyama; Nobuyuki
Patent Applications and Registrations
Patent applications and USPTO patent grants for Akiyama; Nobuyuki.The latest application filed is for "gas sensor electrode and method for producing same".
Company Profile
3.35.10
- Akiyama; Nobuyuki - Hiratsuka JP
- AKIYAMA; Nobuyuki - Hiratsuka-shi Kanagawa
- Akiyama; Nobuyuki - Mishima JP
- Akiyama; Nobuyuki - Inashiki-gun JP
- Akiyama; Nobuyuki - Tokyo JP
- Akiyama; Nobuyuki - Yokohama JP
Patent Activity
| Patent | Date |
|---|---|
| Noble metal paste for bonding of semiconductor element Grant 10,366,963 - Miyairi , et al. July 30, 2 | 2019-07-30 |
| Gas Sensor Electrode and Method for Producing Same App 20190094173 - OKAMOTO; Nobuhisa ; et al. | 2019-03-28 |
| Metal Paste For Gas Sensor Electrode Formation App 20190041350 - OKAMOTO; Nobuhisa ; et al. | 2019-02-07 |
| Metal paste for gas sensor electrode formation Grant 10,106,691 - Okamoto , et al. October 23, 2 | 2018-10-23 |
| Noble Metal Paste For Bonding Of Semiconductor Element App 20180151531 - Miyairi; Masayuki ; et al. | 2018-05-31 |
| Metal Paste For Gas Sensor Electrode Formation App 20170328860 - OKAMOTO; Nobuhisa ; et al. | 2017-11-16 |
| Metal paste for gas sensor electrode formation Grant 9,758,680 - Okamoto , et al. September 12, 2 | 2017-09-12 |
| Precious metal paste for bonding semiconductor element Grant 9,539,671 - Miyairi , et al. January 10, 2 | 2017-01-10 |
| Computer Readable Medium, Information Processing Apparatus, And Method App 20160357470 - Hamaguchi; Naotaka ; et al. | 2016-12-08 |
| Metal Paste For Gas Sensor Electrode Formation App 20150353742 - OKAMOTO; Nobuhisa ; et al. | 2015-12-10 |
| Noble Metal Paste For Bonding Of Semiconductor Element App 20130168437 - Miyairi; Masayuki ; et al. | 2013-07-04 |
| Method Of Manufacturing Silicon Thin Film, Method Of Manufacturing Silicon Thin-film Photovoltaic Cell, Silicon Thin Film, And Silicon Thin-film Photovoltaic Cell App 20120160325 - Akiyama; Nobuyuki | 2012-06-28 |
| Flame detector Grant 8,201,973 - Kudoh , et al. June 19, 2 | 2012-06-19 |
| Fire detector Grant D651,926 - Akiyama , et al. January 10, 2 | 2012-01-10 |
| Fire detector Grant D621,287 - Kaneko , et al. August 10, 2 | 2010-08-10 |
| Flame Detector App 20100073926 - Kudoh; Akihisa ; et al. | 2010-03-25 |
| Fire detector Grant D382,217 - Akiyama , et al. August 12, 1 | 1997-08-12 |
| Method for producing thin film multilayer substrate, and method and apparatus for detecting circuit conductor pattern of the substrate Grant 5,278,012 - Yamanaka , et al. January 11, 1 | 1994-01-11 |
| Energy storage system Grant 5,245,270 - Akiyama September 14, 1 | 1993-09-14 |
| Method for detecting foreign matter and device for realizing same Grant 5,046,847 - Nakata , et al. September 10, 1 | 1991-09-10 |
| Method and apparatus for detecting foreign particle Grant 4,965,454 - Yamauchi , et al. October 23, 1 | 1990-10-23 |
| Method and apparatus for position detection on reduction-projection system Grant 4,938,598 - Akiyama , et al. July 3, 1 | 1990-07-03 |
| Method of correcting defect in circuit pattern Grant 4,925,755 - Yamaguchi , et al. May 15, 1 | 1990-05-15 |
| Substrate surface deflecting device Grant 4,788,577 - Akiyama , et al. November 29, 1 | 1988-11-29 |
| Surface flaw detection method Grant 4,647,196 - Kuni , et al. March 3, 1 | 1987-03-03 |
| Automatic contaminants detection apparatus Grant 4,614,427 - Koizumi , et al. September 30, 1 | 1986-09-30 |
| Apparatus for detecting contaminants on the reticle of exposure system Grant 4,541,715 - Akiyama , et al. September 17, 1 | 1985-09-17 |
| Pattern detection system Grant 4,508,453 - Hara , et al. April 2, 1 | 1985-04-02 |
| Wafer transforming device Grant 4,504,045 - Kenbo , et al. March 12, 1 | 1985-03-12 |
| Flatness measuring device Grant 4,491,787 - Akiyama , et al. January 1, 1 | 1985-01-01 |
| Exposure process and system Grant 4,475,223 - Taniguchi , et al. October 2, 1 | 1984-10-02 |
| Test apparatus for defects of plate Grant 4,460,273 - Koizumi , et al. July 17, 1 | 1984-07-17 |
| Method of inspecting microscopic surface defects Grant 4,449,818 - Yamaguchi , et al. May 22, 1 | 1984-05-22 |
| Focusing position detecting device in optical magnifying and observing apparatus Grant 4,433,235 - Akiyama , et al. February 21, 1 | 1984-02-21 |
| Method and apparatus for inspecting specimen surface Grant 4,423,331 - Koizumi , et al. December 27, 1 | 1983-12-27 |
| X-Ray exposure apparatus Grant 4,403,336 - Taniguchi , et al. September 6, 1 | 1983-09-06 |
| Light exposure device and method Grant 4,391,511 - Akiyama , et al. July 5, 1 | 1983-07-05 |
| Method and apparatus for projection type mask alignment Grant 4,362,389 - Koizumi , et al. December 7, 1 | 1982-12-07 |
| Shape testing apparatus Grant 4,343,553 - Nakagawa , et al. August 10, 1 | 1982-08-10 |
| Apparatus for automatically checking external appearance of object Grant 4,242,702 - Kuni , et al. December 30, 1 | 1980-12-30 |
| Method and apparatus for reduction-projection type mask alignment Grant 4,153,371 - Koizumi , et al. May 8, 1 | 1979-05-08 |
| Alignment pattern detecting apparatus Grant 4,115,762 - Akiyama , et al. September 19, 1 | 1978-09-19 |
| Surface-defect detecting device Grant 4,095,905 - Kuni , et al. June 20, 1 | 1978-06-20 |
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