Akita; Seiji
Patent Applications and Registrations
Patent applications and USPTO patent grants for Akita; Seiji.The latest application filed is for "nanosize heater-mounted nozzle and method for manufacturing same and method for forming micro thin film".
- Akita; Seiji - Osaka JP
- Akita; Seiji - Izumi JP
- Akita, Seiji - Izumi-city JP
- Akita, Seiji - Izumi-shi JP
| Patent | Date |
|---|---|
| Nanosize Heater-Mounted Nozzle and Method for Manufacturing Same and Method for Forming Micro Thin Film App 20080113086 - Akita; Seiji ; et al. | 2008-05-15 |
| Nanotube probe and method for manufacturing same Grant 7,138,627 - Nakayama , et al. November 21, 2 | 2006-11-21 |
| Coated nanotube surface signal probe Grant 7,064,341 - Nakayama , et al. June 20, 2 | 2006-06-20 |
| Nanotube cartridge and a method for manufacturing the same Grant 6,892,432 - Nakayama , et al. May 17, 2 | 2005-05-17 |
| Nanotweezers and nanomanipulator Grant 6,805,390 - Nakayama , et al. October 19, 2 | 2004-10-19 |
| Nanotweezers and nanomanipulator Grant 6,802,549 - Nakayama , et al. October 12, 2 | 2004-10-12 |
| Coated nanotube surface signal probe and method of attaching nanotube to probe holder Grant 6,800,865 - Nakayama , et al. October 5, 2 | 2004-10-05 |
| Conductive probe for scanning microscope and machining method using the same Grant 6,787,769 - Nakayama , et al. September 7, 2 | 2004-09-07 |
| Coated nanotube surface signal probe App 20040168527 - Nakayama, Yoshikazu ; et al. | 2004-09-02 |
| Sharpening method of nanotubes Grant 6,777,637 - Nakayama , et al. August 17, 2 | 2004-08-17 |
| Probe for scanning microscope produced by focused ion beam machining Grant 6,759,653 - Nakayama , et al. July 6, 2 | 2004-07-06 |
| Electroconductive container of a nanotube product App 20040079673 - Nakayama, Yoshikazu ; et al. | 2004-04-29 |
| Nanotube length control method Grant 6,719,602 - Nakayama , et al. April 13, 2 | 2004-04-13 |
| Cantilever for vertical scanning microscope and probe for vertical scan microscope Grant 6,705,154 - Nakayama , et al. March 16, 2 | 2004-03-16 |
| Nanotweezers and nanomanipulator Grant 6,669,256 - Nakayama , et al. December 30, 2 | 2003-12-30 |
| Nanotweezers and nanomanipulator App 20030189351 - Nakayama, Yoshikazu ; et al. | 2003-10-09 |
| Nanotweezers and nanomanipulator App 20030189350 - Nakayama, Yoshikazu ; et al. | 2003-10-09 |
| Sharpening method of nanotubes App 20030186625 - Nakayama, Yoshikazu ; et al. | 2003-10-02 |
| Coated nanotube surface signal probe and method of attaching nanotube to probe holder App 20030122073 - Nakayama, Yoshikazu ; et al. | 2003-07-03 |
| Fusion-welded nanotube surface signal probe and method of attaching nanotube to probe holder Grant 6,528,785 - Nakayama , et al. March 4, 2 | 2003-03-04 |
| Probe for scanning microscope produced by focused ion beam machining App 20030029996 - Nakayama, Yoshikazu ; et al. | 2003-02-13 |
| Cantilever for vertical scanning microscope and probe for vertical scan microscope App 20030010100 - Nakayama, Yoshikazu ; et al. | 2003-01-16 |
| Nanotube length control method App 20030010755 - Nakayama, Yoshikazu ; et al. | 2003-01-16 |
| Conductive probe for scanning microscope and machining method using the same App 20030001091 - Nakayama, Yoshikazu ; et al. | 2003-01-02 |
| Nanotweezers and nanomanipulator App 20020158480 - Nakayama, Yoshikazu ; et al. | 2002-10-31 |
| Nanotube cartridge and a method for manufacturing the same App 20020069505 - Nakayama, Yoshikazu ; et al. | 2002-06-13 |
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