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name:-0.0065958499908447
name:-0.002208948135376
Akbulut; Mustafa Patent Filings

Akbulut; Mustafa

Patent Applications and Registrations

Patent applications and USPTO patent grants for Akbulut; Mustafa.The latest application filed is for "synthetically modified thermoplastic polymer composites having cellulose nanomaterials".

Company Profile
2.6.7
  • Akbulut; Mustafa - College Station TX
  • Akbulut; Mustafa - Milpitas CA
  • Akbulut; Mustafa - Milipitas CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Synthetically modified thermoplastic polymer composites having cellulose nanomaterials
Grant 11,225,554 - Teipel , et al. January 18, 2
2022-01-18
Synthetically Modified Thermoplastic Polymer Composites Having Cellulose Nanomaterials
App 20200262986 - Teipel; Blake ;   et al.
2020-08-20
Flexible and compliant thermal interface materials with ultrahigh thermal conductivities
Grant 10,731,269 - Akbulut , et al.
2020-08-04
Synthetically modified thermoplastic polymer composites having cellulose nanomaterials
Grant 10,626,226 - Teipel , et al.
2020-04-21
Flexible And Compliant Thermal Interface Materials With Ultrahigh Thermal Conductivities
App 20180216248 - Akbulut; Mustafa ;   et al.
2018-08-02
Synthetically Modified Thermoplastic Polymer Composites Having Cellulose Nanomaterials
App 20180186940 - Teipel; Blake ;   et al.
2018-07-05
System and methods for classifying anomalies of sample surfaces
Grant 7,315,365 - Chen , et al. January 1, 2
2008-01-01
System and methods for classifying anomalies of sample surfaces
App 20060192951 - Chen; Wayne ;   et al.
2006-08-31
System and methods for classifying anomalies of sample surfaces
Grant 7,038,772 - Chen , et al. May 2, 2
2006-05-02
System and methods for classifying anomalies of sample surfaces
Grant 7,016,031 - Chen , et al. March 21, 2
2006-03-21
System and methods for classifying anomalies of sample surfaces
App 20040169852 - Chen, Wayne ;   et al.
2004-09-02
System and methods for classifying anomalies of sample surfaces
App 20040085532 - Chen, Wayne ;   et al.
2004-05-06

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