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Patent applications and USPTO patent grants for Akashi; Tetsuya.The latest application filed is for "image collection system".
Patent | Date |
---|---|
Interferometric electron microscope Grant 11,011,344 - Tanigaki , et al. May 18, 2 | 2021-05-18 |
Image Collection System App 20210110992 - TAKAHASHI; Yoshio ;   et al. | 2021-04-15 |
Sample holding mechanism, manufacturing method for same, and charged particle beam device Grant 10,872,743 - Sugawara , et al. December 22, 2 | 2020-12-22 |
Interferometric Electron Microscope App 20200273657 - TANIGAKI; Toshiaki ;   et al. | 2020-08-27 |
Electron microscope for magnetic field measurement and magnetic field measurement method Grant 10,629,410 - Tanigaki , et al. | 2020-04-21 |
Electron Microscope For Magnetic Field Measurement And Magnetic Field Measurement Method App 20190295817 - TANIGAKI; Toshiaki ;   et al. | 2019-09-26 |
Sample Holding Mechanism, Manufacturing Method For Same, And Charged Particle Beam Device App 20190027338 - SUGAWARA; Akira ;   et al. | 2019-01-24 |
Interferometer Grant 7,872,755 - Harada , et al. January 18, 2 | 2011-01-18 |
Electron interferometer or electron microscope Grant 7,816,648 - Harada , et al. October 19, 2 | 2010-10-19 |
Interferometer having three electron biprisms Grant 7,750,298 - Harada , et al. July 6, 2 | 2010-07-06 |
Charged particle beam equipment Grant 7,655,905 - Harada , et al. February 2, 2 | 2010-02-02 |
Interferometer App 20090273789 - Harada; Ken ;   et al. | 2009-11-05 |
Interferometer Grant 7,538,323 - Harada , et al. May 26, 2 | 2009-05-26 |
Charged particle beam equipment App 20090045339 - Harada; Ken ;   et al. | 2009-02-19 |
Electron Interferometer or Electron Microscope App 20080302965 - Harada; Ken ;   et al. | 2008-12-11 |
Interferometer App 20080258058 - Harada; Ken ;   et al. | 2008-10-23 |
Method for securing screw means onto metal plate and metal plate having screw means secured Grant 4,114,670 - Akashi , et al. September 19, 1 | 1978-09-19 |
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