loadpatents
name:-0.0084710121154785
name:-0.0059869289398193
name:-0.00046086311340332
Akasaki; Yuji Patent Filings

Akasaki; Yuji

Patent Applications and Registrations

Patent applications and USPTO patent grants for Akasaki; Yuji.The latest application filed is for "method to determine needle mark and program therefor".

Company Profile
0.5.6
  • Akasaki; Yuji - Tokyo N/A JP
  • Akasaki; Yuji - Kawasaki JP
  • Akasaki; Yuji - Shinjuku JP
  • Akasaki, Yuji - Aizuwakamatsu JP
  • Akasaki; Yuji - Satsuma JP
  • Akasaki; Yuji - Kagoshima JP
  • AKASAKI, YUJI - SATSUMA-GUN JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method to determine needle mark and program therefor
Grant 8,436,633 - Sano , et al. May 7, 2
2013-05-07
Component for testing device for electronic component and testing method of the electronic component
Grant 7,977,961 - Koizumi , et al. July 12, 2
2011-07-12
Method To Determine Needle Mark And Program Therefor
App 20100237894 - Sano; Satoshi ;   et al.
2010-09-23
Laser Cleaning Apparatus And Laser Cleaning Method
App 20100038560 - Tokura; Fumihiko ;   et al.
2010-02-18
Component For Testing Device For Electronic Component And Testing Method Of The Electronic Component
App 20090302876 - KOIZUMI; Daisuke ;   et al.
2009-12-10
Method and apparatus for testing image pickup device
App 20050162517 - Fujihara, Katsumi ;   et al.
2005-07-28
Semiconductor device having a signal lead exposed on the undersurface of a sealing resin with an air gap between the signal lead and a mounting substrate
Grant 6,781,223 - Mihara , et al. August 24, 2
2004-08-24
Semiconductor device having a signal lead exposed on the undersurface of a sealing resin with an air gap between the signal lead and a mounting substrate
App 20030102550 - Mihara, Takayuki ;   et al.
2003-06-05
Method and apparatus for testing semiconductor devices
Grant 6,392,433 - Itasaka , et al. May 21, 2
2002-05-21
Method And Apparatus For Testing Semiconductor Devices
App 20010043076 - ITASAKA, KENJI ;   et al.
2001-11-22

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