Akamatsu; Masaru
Patent Applications and Registrations
Patent applications and USPTO patent grants for Akamatsu; Masaru.The latest application filed is for "rotational misalignment measuring device of bonded substrate, rotational misalignment measuring method of bonded substrate, and method of manufacturing bonded substrate".
- Akamatsu; Masaru - Kobe JP
- Akamatsu; Masaru - Kobe-shi JP
- Akamatsu; Masaru - Hyogo JP
| Patent | Date |
|---|---|
| Rotational misalignment measuring device of bonded substrate, rotational misalignment measuring method of bonded substrate, and method of manufacturing bonded substrate Grant 9,354,047 - Kannaka , et al. May 31, 2 | 2016-05-31 |
| Rotational Misalignment Measuring Device Of Bonded Substrate, Rotational Misalignment Measuring Method Of Bonded Substrate, And Method Of Manufacturing Bonded Substrate App 20130139950 - KANNAKA; Masato ; et al. | 2013-06-06 |
| Shape measurement apparatus and shape measurement method Grant 8,310,536 - Akamatsu , et al. November 13, 2 | 2012-11-13 |
| Shape measuring device Grant 8,228,509 - Akamatsu , et al. July 24, 2 | 2012-07-24 |
| Shape Measuring Device App 20100302551 - Akamatsu; Masaru ; et al. | 2010-12-02 |
| Shape Measurement Apparatus And Shape Measurement Method App 20100134615 - Akamatsu; Masaru ; et al. | 2010-06-03 |
| Shape measuring apparatus Grant 7,456,978 - Akamatsu November 25, 2 | 2008-11-25 |
| Shape measuring apparatus App 20060109484 - Akamatsu; Masaru | 2006-05-25 |
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