Akaike; Shinji

Patent Applications and Registrations

Patent applications and USPTO patent grants for Akaike; Shinji.The latest application filed is for "position accuracy inspecting method, position accuracy inspecting apparatus, and position inspecting unit".

Company Profile

1.5.5

Akaike; Shinji - Yamanashi JP
Akaike; Shinji - Nirasaki JP
Akaike; Shinji - Nirasaki-shi Yamanashi
AKAIKE; Shinji - Nirasaki City JP
Akaike; Shinji - Kofu JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Probe apparatus and probe method Grant 10,310,010 - Tamura , et al.	2019-06-04
Substrate inspection apparatus and control method thereof Grant 10,074,192 - Saiki , et al. September 11, 2	2018-09-11
Position accuracy inspecting method, position accuracy inspecting apparatus, and position inspecting unit Grant 10,006,941 - Saiki , et al. June 26, 2	2018-06-26
Position Accuracy Inspecting Method, Position Accuracy Inspecting Apparatus, And Position Inspecting Unit App 20170219625 - Saiki; Kenta ; et al.	2017-08-03
Probe Apparatus And Probe Method App 20160161553 - TAMURA; Muneaki ; et al.	2016-06-09
Substrate Inspection Apparatus and Control Method Thereof App 20160098837 - SAIKI; Kenta ; et al.	2016-04-07
Bonding Device, Bonding System, And Bonding Method App 20160001543 - AKIYAMA; Naoki ; et al.	2016-01-07
Bonding Device And Bonding Method App 20150017782 - AKIYAMA; Naoki ; et al.	2015-01-15
Probe system and probe method Grant 5,640,101 - Kuji , et al. June 17, 1	1997-06-17
Probe system having vertical height detection and double focal image pickup coinciding with probe contact in height adjustment Grant 5,585,738 - Kuji , et al. December 17, 1	1996-12-17

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