loadpatents
Patent applications and USPTO patent grants for AKADA; Tomohiro.The latest application filed is for "profile measurement system and profile measurement method".
Patent | Date |
---|---|
Profile Measurement System And Profile Measurement Method App 20150106057 - SUGITA; Kazuhiro ;   et al. | 2015-04-16 |
Method for measuring gap of liquid crystal cell Grant 7,230,713 - Akada , et al. June 12, 2 | 2007-06-12 |
Method for measuring gap of liquid crystal cell App 20040233432 - Akada, Tomohiro ;   et al. | 2004-11-25 |
Method and apparatus for measuring cell gap of VA liquid crystal panel Grant 6,628,389 - Akada , et al. September 30, 2 | 2003-09-30 |
Spectroscope Grant 4,922,309 - Sekiwa , et al. May 1, 1 | 1990-05-01 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.