Aizawa; Kento

Patent Applications and Registrations

Patent applications and USPTO patent grants for Aizawa; Kento.The latest application filed is for "foreign matter analysis method, storage medium storing foreign matter analysis program, and foreign matter analysis apparatus".

Company Profile

4.4.6

Aizawa; Kento - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Foreign matter analysis Method, storage medium storing foreign matter analysis program, and foreign matter analysis apparatus Grant 11,248,962 - Aizawa , et al. February 15, 2	2022-02-15
Foreign Matter Analysis Method, Storage Medium Storing Foreign Matter Analysis Program, And Foreign Matter Analysis Apparatus App 20210247233 - AIZAWA; Kento ; et al.	2021-08-12
Raman Microscope Having Fluorescence Observation Function And Filter Unit App 20210190692 - AIZAWA; Kento ; et al.	2021-06-24
Microspectroscope having automatic sample detection function Grant 11,029,208 - Aizawa , et al. June 8, 2	2021-06-08
Microspectroscope Having Position Correction Function App 20200292802 - AIZAWA; Kento ; et al.	2020-09-17
Microspectroscope Having Automatic Sample Detection Function App 20200271522 - AIZAWA; Kento ; et al.	2020-08-27
Microspectroscope Grant 10,295,470 - Aizawa , et al.	2019-05-21
Infrared microscope Grant 10,234,665 - Aizawa , et al.	2019-03-19
Infrared Microscope App 20180307018 - AIZAWA; Kento ; et al.	2018-10-25
Microspectroscope App 20180067053 - AIZAWA; Kento ; et al.	2018-03-08

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