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name:-0.0054268836975098
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Ainspan; Herschel Patent Filings

Ainspan; Herschel

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ainspan; Herschel.The latest application filed is for "digital measuring system and method for integrated circuit chip operating parameters".

Company Profile
0.3.3
  • Ainspan; Herschel - New Hempstead NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Digital measuring system and method for integrated circuit chip operating parameters
Grant 7,813,815 - Ainspan , et al. October 12, 2
2010-10-12
Method to differentially control LC voltage-controlled oscillators
Grant 7,292,115 - Soltanian , et al. November 6, 2
2007-11-06
Digital Measuring System And Method For Integrated Circuit Chip Operating Parameters
App 20070101227 - Ainspan; Herschel ;   et al.
2007-05-03
Digital measuring system and method for integrated circuit chip operating parameters
Grant 7,168,853 - Ainspan , et al. January 30, 2
2007-01-30
Method to differentially control LC voltage-controlled oscillators
App 20060238265 - Soltanian; Babak ;   et al.
2006-10-26
Digital measuring system and method for integrated circuit chip operating parameters
App 20040136436 - Ainspan, Herschel ;   et al.
2004-07-15

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