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Patent applications and USPTO patent grants for Aikawa; Tetsuro.The latest application filed is for "radiation measurement apparatus".
Patent | Date |
---|---|
Three-dimensional distance measurement apparatus and method therefor Grant 9,214,024 - Oodake , et al. December 15, 2 | 2015-12-15 |
Radiation measurement apparatus Grant 9,170,339 - Satoh , et al. October 27, 2 | 2015-10-27 |
Radiation Measurement Apparatus App 20150117613 - Satoh; Yoshinori ;   et al. | 2015-04-30 |
Welding target position measurement device Grant 9,010,614 - Ohdake , et al. April 21, 2 | 2015-04-21 |
Visual inspection apparatus and visual inspection method Grant 8,976,242 - Aikawa , et al. March 10, 2 | 2015-03-10 |
Apparatus for inspecting and measuring object to be measured Grant 8,483,444 - Aikawa , et al. July 9, 2 | 2013-07-09 |
Welding Target Position Measurement Device App 20130098971 - OHDAKE; Tatsuya ;   et al. | 2013-04-25 |
Appearance inspection apparatus and appearance inspection method Grant 8,379,081 - Aikawa , et al. February 19, 2 | 2013-02-19 |
Three-dimensional Distance Measurement Apparatus And Method Therefor App 20130021452 - Oodake; Tatsuya ;   et al. | 2013-01-24 |
Laser ultrasonic detection device including a laser oscillating device which includes a seed laser oscillating element Grant 8,115,936 - Ochiai , et al. February 14, 2 | 2012-02-14 |
Visual Inspection Apparatus And Visual Inspection Method App 20100283847 - Aikawa; Tetsuro ;   et al. | 2010-11-11 |
Laser-based Maintenance Apparatus App 20100199769 - OCHIAI; Makoto ;   et al. | 2010-08-12 |
Apparatus For Inspecting And Measuring Object To Be Measured App 20100183197 - Aikawa; Tetsuro ;   et al. | 2010-07-22 |
Appearance Inspection Apparatus And Appearance Inspection Method App 20100129059 - Aikawa; Tetsuro ;   et al. | 2010-05-27 |
Laser-based maintenance apparatus App 20070157730 - Ochiai; Makoto ;   et al. | 2007-07-12 |
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