Ahn; Woo Jung
Patent Applications and Registrations
Patent applications and USPTO patent grants for Ahn; Woo Jung.The latest application filed is for "depositing apparatus for forming thin film".
- Ahn; Woo Jung - Gyeonggi-do KR
- Ahn; Woo Jung - Seongnam-si KR
- Ahn; Woo Jung - Seoul KR
| Patent | Date |
|---|---|
| Estimating thickness based on number of peaks between two peaks in scanning white light interferometry Grant 8,947,673 - Pahk , et al. February 3, 2 | 2015-02-03 |
| Plasma monitoring device and method Grant 8,416,293 - Shin , et al. April 9, 2 | 2013-04-09 |
| Depositing Apparatus For Forming Thin Film App 20120260855 - CHO; Whang Sin ; et al. | 2012-10-18 |
| Method for measuring thickness Grant 8,279,447 - Pahk , et al. October 2, 2 | 2012-10-02 |
| Apparatus for measuring thickness Grant 8,199,332 - Pahk , et al. June 12, 2 | 2012-06-12 |
| Vision inspection system and method for inspecting workpiece using the same Grant 8,116,555 - Ahn , et al. February 14, 2 | 2012-02-14 |
| Method for Measuring Thickness or Surface Profile App 20110188048 - Pahk; Heui Jae ; et al. | 2011-08-04 |
| Apparatus for Measuring Thickness App 20110001988 - Pahk; Heui-Jae ; et al. | 2011-01-06 |
| Method for Measuring Thickness App 20100277745 - Pahk; Heui-Jae ; et al. | 2010-11-04 |
| Plasma Monitoring Device And Method App 20100149326 - Shin; Heung Hyun ; et al. | 2010-06-17 |
| Vision Inspection System And Method For Inspecting Workpiece Using The Same App 20090087080 - Ahn; Woo Jung ; et al. | 2009-04-02 |
| Non contact measuring method for three dimensional micro pattern in measuring object Grant 6,005,669 - Pahk , et al. December 21, 1 | 1999-12-21 |
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