Ahn; Tae-Heung

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ahn; Tae-Heung.The latest application filed is for "apparatus for measuring wafer".

Company Profile

4.4.6

Ahn; Tae-Heung - Seoul KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Apparatus for measuring wafer Grant 11,029,256 - Ahn , et al. June 8, 2	2021-06-08
Apparatus For Measuring Wafer App 20210025832 - AHN; Tae-Heung ; et al.	2021-01-28
Wafer inspection apparatus and wafer inspection method using the same Grant 10,733,719 - Ahn , et al.	2020-08-04
Apparatus for inspecting material property of plurality of measurement objects Grant 10,473,579 - Ahn , et al. Nov	2019-11-12
Atomic Emission Spectrometer Based On Laser-induced Plasma (lip), Semiconductor Manufacturing Facility Including The Atomic Emission Spectrometer, And Method Of Manufacturing Semiconductor Device Using The Atomic Emission Spectrometer App 20190094072 - PARK; Sang-gil ; et al.	2019-03-28
Apparatus For Inspecting Material Property Of Plurality Of Measurement Objects App 20190079003 - Ahn; Tae-Heung ; et al.	2019-03-14
Surface inspecting method Grant 10,001,444 - Ko , et al. June 19, 2	2018-06-19
Substrate Inspection System App 20180164227 - KIM; Taejoong ; et al.	2018-06-14
Wafer Inspection Apparatus And Wafer Inspection Method Using The Same App 20180061041 - AHN; Tae Heung ; et al.	2018-03-01
Surface Inspecting Method App 20160153915 - Ko; Kang-woong ; et al.	2016-06-02

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